RISS 학술연구정보서비스

검색

인기 검색어

    다국어 입력

    http://chineseinput.net/에서 pinyin(병음)방식으로 중국어를 변환할 수 있습니다.

    변환된 중국어를 복사하여 사용하시면 됩니다.

    예시)
    • 中文 을 입력하시려면 zhongwen을 입력하시고 space를누르시면됩니다.
    • 北京 을 입력하시려면 beijing을 입력하시고 space를 누르시면 됩니다.
    닫기
    KCI등재

    부분공정 태양전지를 이용한 결정질 태양전지의 강도 특성에 관한 연구 = Determination of the Strength Characteristics of c-Si Solar Cells using Partially Processed Solar Cells

    한글로보기

    https://www.riss.kr/link?id=A107106229

    • 0

      상세조회
    • 0

      다운로드
    서지정보 열기
    • 내보내기
    • 내책장담기
    • 공유하기
      • URL 복사
    • 오류접수
    인용문이 복사되었습니다.

    부가정보

    다국어 초록 (Multilingual Abstract) kakao i 다국어 번역

    Photovoltaic (PV) power system prices have been steadily dropping in recent years due to their mass production and advances in relevant technology. Crystalline silicon (c-Si wafers) account for the largest share of the price of solar cells; reducing the thickness of these wafers is an essential part of increasing the price competitiveness of PV power systems. However, reducing the thickness of c-Si wafers is challenging; typically, phenomena such as bowing and cracking are encountered. While several approaches to address the bowing phenomenon of the c-Si solar cells exist, the only method to study the crack phenomenon (related to the strength of the c-Si solar cells) is the bending test method. Moreover, studies on determining the strength properties of the solar cells have focused largely on c-Si wafers, while those on the strength properties of front and rear-side electrodes and SiNx, the other components of c-Si solar cells, are scarce. In this study, we analyzed the strength characteristics of each layer of c-Si solar cells. The strength characteristics of the sawing mark direction produced during the production of c-Si wafers were also tested. Experiments were conducted using a 4bending tester for a specially manufactured c-Si solar cell. The results indicate that the back side electrode is the main component that experienced bowing, while the front electrode was the primary component regulating the strength of the c-Si solar cell.
    번역하기

    Photovoltaic (PV) power system prices have been steadily dropping in recent years due to their mass production and advances in relevant technology. Crystalline silicon (c-Si wafers) account for the largest share of the price of solar cells; reducing t...

    Photovoltaic (PV) power system prices have been steadily dropping in recent years due to their mass production and advances in relevant technology. Crystalline silicon (c-Si wafers) account for the largest share of the price of solar cells; reducing the thickness of these wafers is an essential part of increasing the price competitiveness of PV power systems. However, reducing the thickness of c-Si wafers is challenging; typically, phenomena such as bowing and cracking are encountered. While several approaches to address the bowing phenomenon of the c-Si solar cells exist, the only method to study the crack phenomenon (related to the strength of the c-Si solar cells) is the bending test method. Moreover, studies on determining the strength properties of the solar cells have focused largely on c-Si wafers, while those on the strength properties of front and rear-side electrodes and SiNx, the other components of c-Si solar cells, are scarce. In this study, we analyzed the strength characteristics of each layer of c-Si solar cells. The strength characteristics of the sawing mark direction produced during the production of c-Si wafers were also tested. Experiments were conducted using a 4bending tester for a specially manufactured c-Si solar cell. The results indicate that the back side electrode is the main component that experienced bowing, while the front electrode was the primary component regulating the strength of the c-Si solar cell.

    더보기

    참고문헌 (Reference)

    1 김용성, "전도성 페이스트 도포량 변화에 따른 결정질 태양광 모듈의 전기적 특성에 대한 영향성 분석" 한국재료학회 29 (29): 720-726, 2019

    2 Grief, M. K, "Warpage and Mechanical Strength Studies of Ultra Thin 150 mm Wafers" 190-194, 1996

    3 윤희상, "SnBiAg 전도성 페이스트를 이용한Shingled 결정질 태양광 모듈의 전기적 특성 분석" 한국재료학회 28 (28): 528-533, 2018

    4 Behnken, H., "Simulation of Mechnical Stress During Teests for Crystalline Wafers" 1308-1311, 2003

    5 Echizenya, D., "Effect of Mechanical Surface Damage on Silicon Wafer Strength" 10 : 1440-1445, 2011

    6 Song, H. J., "Conductive Paste Assisted Interconnection for Environmentally Benign Lead-free Ribbons in c-Si PV Modules" 184 : 273-280,

    7 Baek, T. H., "Bow Reduction in Thin Crystalline Silicon Solar Cell with Control of Real Aluminum Layer Thickness" 32 (32): 194-198, 2012

    8 Schneider, A., "Bow Reducing Factors For thin Screenprinted Mc-Si Solar Cells with Al BSF" 336-339, 2020

    9 Lai, C. M., "Analysis of the Thermal Stress and Warpage Induced by Soldering in Monocrystalline Silicon Cells" 55 (55): 7-16, 2013

    10 Lim, J. R., "Analysis of the Bowing Phenomenon for Thin c-Si Solar Cells using Partially Processed c-Si Solar Cells" 12 (12): 1-12, 2019

    1 김용성, "전도성 페이스트 도포량 변화에 따른 결정질 태양광 모듈의 전기적 특성에 대한 영향성 분석" 한국재료학회 29 (29): 720-726, 2019

    2 Grief, M. K, "Warpage and Mechanical Strength Studies of Ultra Thin 150 mm Wafers" 190-194, 1996

    3 윤희상, "SnBiAg 전도성 페이스트를 이용한Shingled 결정질 태양광 모듈의 전기적 특성 분석" 한국재료학회 28 (28): 528-533, 2018

    4 Behnken, H., "Simulation of Mechnical Stress During Teests for Crystalline Wafers" 1308-1311, 2003

    5 Echizenya, D., "Effect of Mechanical Surface Damage on Silicon Wafer Strength" 10 : 1440-1445, 2011

    6 Song, H. J., "Conductive Paste Assisted Interconnection for Environmentally Benign Lead-free Ribbons in c-Si PV Modules" 184 : 273-280,

    7 Baek, T. H., "Bow Reduction in Thin Crystalline Silicon Solar Cell with Control of Real Aluminum Layer Thickness" 32 (32): 194-198, 2012

    8 Schneider, A., "Bow Reducing Factors For thin Screenprinted Mc-Si Solar Cells with Al BSF" 336-339, 2020

    9 Lai, C. M., "Analysis of the Thermal Stress and Warpage Induced by Soldering in Monocrystalline Silicon Cells" 55 (55): 7-16, 2013

    10 Lim, J. R., "Analysis of the Bowing Phenomenon for Thin c-Si Solar Cells using Partially Processed c-Si Solar Cells" 12 (12): 1-12, 2019

    11 Kim, S., "Alumium Paste(lead-free/low-bow)For Thin wafers" 1100-1102, 2005

    더보기

    동일학술지(권/호) 다른 논문

    분석정보

    View

    상세정보조회

    0

    Usage

    원문다운로드

    0

    대출신청

    0

    복사신청

    0

    EDDS신청

    0

    동일 주제 내 활용도 TOP

    더보기

    주제

    연도별 연구동향

    연도별 활용동향

    연관논문

    연구자 네트워크맵

    공동연구자 (7)

    유사연구자 (20) 활용도상위20명

    인용정보 인용지수 설명보기

    학술지 이력

    학술지 이력
    연월일 이력구분 이력상세 등재구분
    2023 평가 재인증평가 신청대상 (재인증)
    2020-01-01 등재 등재학술지 선정 (재인증) KCI등재
    2019-01-01 등재 등재후보학술지 유지 (계속평가) KCI등재후보
    2018-01-01 등재 등재후보학술지 유지 (계속평가) KCI등재후보
    2017-12-01 등재 등재후보로 하락 (계속평가) KCI등재후보
    2013-01-01 등재 등재학술지 유지 (등재유지) KCI등재
    2010-01-01 등재 등재학술지 유지 (등재유지) KCI등재
    2008-01-01 등재 등재학술지 유지 (등재유지) KCI등재
    2005-01-01 등재 등재학술지 선정 (등재후보2차) KCI등재
    2004-01-01 등재 등재후보 1차 PASS (등재후보1차) KCI등재후보
    2002-01-01 등재 등재후보학술지 선정 (신규평가) KCI등재후보
    더보기

    학술지 인용정보

    학술지 인용정보
    기준연도 WOS-KCI 통합IF(2년) KCIF(2년) KCIF(3년)
    2016 0.28 0.28 0.28
    KCIF(4년) KCIF(5년) 중심성지수(3년) 즉시성지수
    0.27 0.25 0.618 0.26
    더보기

    이 자료와 함께 이용한 RISS 자료

    나만을 위한 추천자료

    해외이동버튼