Employment of Wheat Grain Properties in Evaluation of Fusarium Head Blight Resistance

다국어 초록 (Multilingual Abstract)

Fusarium head blight (FHB) caused by Fusarium graminearum is one of the most destructive fungal diseases. Wide spread of FHB causes yield loss, quality reduction, and accumulation of poisonous mycotoxins. Twenty-three Korean wheat cultivars and a known FHB resistant cultivar ‘Sumai 3’ were tested for Type I and Type II resistance to FHB and evaluated for grain characteristics.
Wheat cultivars showed infection scores of 0.6 (the lowest) to 7.8 (the highest) in response to the Fusarium inoculation for Type I evaluation. Three Korean cultivars, ‘Chungkye’ (1.8), ‘Tapdong’ (1.8), and ‘Jinpoom’ (1.6) showed relatively good FHB resistance compared to ‘Sumai 3’ (0.6) for Type I evaluation. On the other hand, Type II evaluation scores ranged between 1.4 and 3.6. The infection scores of ‘Uri’ (1.4) and ‘Jinpoom’ (1.4) were particularly low and even lower than “Sumai 3” (1.6). The relationship between grain properties and FHB severity was evaluated. Grain length was positively correlated with Type II evaluation. Spike length and total polyphenol content were negatively correlated with FHB severity of Type I evaluation. Grain properties were negatively or positively correlated with FHB severity. The obtained results indicated that some of the grain parameters could be employed in the development of wheat lines with improved FHB resistance.

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