1 Duda, R., "Use of the Hough Trans-formation to Detect Lines and Curves in Pictures" 1972
2 Choi, K.-S., "Real-time Inspection System for Printed Circuit Boards" 2781 : 458-465, 2003
3 Tsai, D. M., "Micro-crack Inspection in Heterogeneously Textured Solar Wafers Using Anisotropic Diffusion" 28 : 491-501, 2010
4 Berng, D.-B., "Auto-mated Bonding Position Inspection of Multi-layered Wire IC Using Machine Vision" 48 (48): 2010
5 Harris, C., "A Combined Corner and Edge Detector" 1988
1 Duda, R., "Use of the Hough Trans-formation to Detect Lines and Curves in Pictures" 1972
2 Choi, K.-S., "Real-time Inspection System for Printed Circuit Boards" 2781 : 458-465, 2003
3 Tsai, D. M., "Micro-crack Inspection in Heterogeneously Textured Solar Wafers Using Anisotropic Diffusion" 28 : 491-501, 2010
4 Berng, D.-B., "Auto-mated Bonding Position Inspection of Multi-layered Wire IC Using Machine Vision" 48 (48): 2010
5 Harris, C., "A Combined Corner and Edge Detector" 1988