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      Enhanced output power of InGaAs/GaAs infrared light-emitting diode with Ga<sub>x</sub>In<sub>1-x</sub>P tensile strain barrier

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      https://www.riss.kr/link?id=A107429058

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      <P>Various GaxIn1-xP strain barriers were evaluated for their ability to compensate for the strain of lattice mismatched InGaAs/GaAs MQWs structures. A GaxIn1-xP (chi = 0.53) tensile strain barrier, which was inserted between the n-confinement and InGaAs/GaAs multi-quantum well (MQW) active region, was effective in reducing the compressive strain caused by In0.07GaAs in multiple quantum wells (MQWs). Importantly, a remarkably enhanced PL intensity was obtained by retuning the strain of In0.07GaAs QWs based on a Ga0.53InP tensile strain barrier. A fabricated IR-LED chip, having retuned In0.08GaAs/GaAs MQWs with a Ga0.53InP tensile strain barrier, yielded double the light output power of the IR-LED chip without a Ga0.53InP strain barrier. This suggests that the use of a Ga0.53InP tensile strain barrier is essential for compensating for the compressive strain of lattice-mismatched InGaAs/GaAs MQWs with a 940 nm emitting wavelength, followed by the improved output power of the IR-LED chips. (C) 2017 Elsevier B.V. All rights reserved.</P>
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      <P>Various GaxIn1-xP strain barriers were evaluated for their ability to compensate for the strain of lattice mismatched InGaAs/GaAs MQWs structures. A GaxIn1-xP (chi = 0.53) tensile strain barrier, which was inserted between the n-confinement a...

      <P>Various GaxIn1-xP strain barriers were evaluated for their ability to compensate for the strain of lattice mismatched InGaAs/GaAs MQWs structures. A GaxIn1-xP (chi = 0.53) tensile strain barrier, which was inserted between the n-confinement and InGaAs/GaAs multi-quantum well (MQW) active region, was effective in reducing the compressive strain caused by In0.07GaAs in multiple quantum wells (MQWs). Importantly, a remarkably enhanced PL intensity was obtained by retuning the strain of In0.07GaAs QWs based on a Ga0.53InP tensile strain barrier. A fabricated IR-LED chip, having retuned In0.08GaAs/GaAs MQWs with a Ga0.53InP tensile strain barrier, yielded double the light output power of the IR-LED chip without a Ga0.53InP strain barrier. This suggests that the use of a Ga0.53InP tensile strain barrier is essential for compensating for the compressive strain of lattice-mismatched InGaAs/GaAs MQWs with a 940 nm emitting wavelength, followed by the improved output power of the IR-LED chips. (C) 2017 Elsevier B.V. All rights reserved.</P>

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