The copper chalcogenide (CuX, X=S, Se) thin films have been irradiated with 100MeV gold swift heavy ions (SHI) at 10<SUP>11</SUP> and 10<SUP>12</SUP> ions/cm<SUP>2</SUP> fluences. The irradiation effects were probed...
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https://www.riss.kr/link?id=A107592139
2009
-
SCI,SCIE,SCOPUS
학술저널
1653-1658(6쪽)
0
상세조회0
다운로드다국어 초록 (Multilingual Abstract)
The copper chalcogenide (CuX, X=S, Se) thin films have been irradiated with 100MeV gold swift heavy ions (SHI) at 10<SUP>11</SUP> and 10<SUP>12</SUP> ions/cm<SUP>2</SUP> fluences. The irradiation effects were probed...
The copper chalcogenide (CuX, X=S, Se) thin films have been irradiated with 100MeV gold swift heavy ions (SHI) at 10<SUP>11</SUP> and 10<SUP>12</SUP> ions/cm<SUP>2</SUP> fluences. The irradiation effects were probed by characterizing physical properties such as XRD, AFM, optical band gap and electrical resistivity of copper chalcogenide thin films. The increase in irradiation fluence increases the particle size, electrical conductivity and PL intensity of the materials, and the optical band edges were red shifted. The results are explained by quantifying electronic energy loss of ions in both the materials.
Effect of illumination on hydrogenated amorphous silicon thin films doped with chalcogens