This paper presents a modified scan cell architecture to reduce the power dissipation during testing. It not only eliminates switching activities in the combinational logic during scan shifting but also reduces switching activities in the scan chain d...
This paper presents a modified scan cell architecture to reduce the power dissipation during testing. It not only eliminates switching activities in the combinational logic during scan shifting but also reduces switching activities in the scan chain during the time. Furthermore, it limits the transitions on capture cycles. It can be made for test-per-scan BIST and employed in both single scan style and multiple scan style. Experimental results demonstrate that the proposed structure achieves the same fault coverage with lower power consumption compared to other existing BIST schemes.