다수개의 지수고장원인이 있는 경우의 최적가속수명시험 설계 및 수명분포의 최우추정 = Maximum Likelihood Estimation and Optimum Design of Accelerated Life Tests under Competing Exponential Causes of Failure

다국어 초록 (Multilingual Abstract)

This paper concerned with maximum likelihood estimation of lifetime distribution under competing causes of failure and optimum design of constant stress accelerated life test plans. The model consists of independent exponential lifetime distributions with mean that is a loglinear function of stress for each failure cause. Likelihood equations are obtained. Minimizing the sun of asymptotic variances of the maximum likelihood estimators of the mean lives at design stress for all causes is used as an optimality criterion. Two stress levels are used and the high stress level is assumed to be given. The optimal low stress level and the proportion of units tested at each stress are obtained and tables for finding optimum plans are given.