1 "Youngs Modulus Measurements of Silicon Nanastructures Using a Scanning Probe System: s Non-Destructive Evaluation Approach" 12 : 1028-1032, 2003
2 "Simultaneous Measurement of Lateral and Normal Forces with an Optical-Beam-Deflection Atomic Force Microscopy: the NaCl (011)Surface" 57 : 2089-2091, 1990
3 "Quasi-Static Bending Test of Nano-Scale SiO2 Wire at Intermediate Temperatures Using AFM-Based Technique" 104 : 78-85, 2003
4 "Quantitative Analysis of Lateral Force Microscopy Experiments, Rev. Sci. Instrum" 67 : 2560, 22-2567, 29, 19961995
5 "Mechanics of Materials, 2nd ed.," 163-165, 1992
6 "Mechanical Property Measurements of Nanoscale Structures Using an Atomic Force Microscope" 91 : 111-118, 2002
7 "Mechanical Characterization of Sub-Micrometer Thick DLC Films by AFM Tensile Testing for Surface Modification in MEMS" 431-434, 2002
8 "Lateral and Longitudinal Spring Constants of Atomic Force Microscopy Cantilever" 65 : 2527-2531, 1994
9 "Handbook of Micro/Nano Tribology" 22-29, 1999
10 "Evaluation of Size Effect on Mechanical Properties of Single Crystal Silicon by Nanoscale Bending Test Using AFM" 9 : 450-459, 2000
1 "Youngs Modulus Measurements of Silicon Nanastructures Using a Scanning Probe System: s Non-Destructive Evaluation Approach" 12 : 1028-1032, 2003
2 "Simultaneous Measurement of Lateral and Normal Forces with an Optical-Beam-Deflection Atomic Force Microscopy: the NaCl (011)Surface" 57 : 2089-2091, 1990
3 "Quasi-Static Bending Test of Nano-Scale SiO2 Wire at Intermediate Temperatures Using AFM-Based Technique" 104 : 78-85, 2003
4 "Quantitative Analysis of Lateral Force Microscopy Experiments, Rev. Sci. Instrum" 67 : 2560, 22-2567, 29, 19961995
5 "Mechanics of Materials, 2nd ed.," 163-165, 1992
6 "Mechanical Property Measurements of Nanoscale Structures Using an Atomic Force Microscope" 91 : 111-118, 2002
7 "Mechanical Characterization of Sub-Micrometer Thick DLC Films by AFM Tensile Testing for Surface Modification in MEMS" 431-434, 2002
8 "Lateral and Longitudinal Spring Constants of Atomic Force Microscopy Cantilever" 65 : 2527-2531, 1994
9 "Handbook of Micro/Nano Tribology" 22-29, 1999
10 "Evaluation of Size Effect on Mechanical Properties of Single Crystal Silicon by Nanoscale Bending Test Using AFM" 9 : 450-459, 2000
11 "Development of AFM-Based Techniques to Measure Mechanical Properties of Nanoscale Structures" 101 : 338-351, 2002
12 "Calibration of Frictional Forces in Atomic Force Microscopy" 67 : 3298-3306, 1996
13 "Atomic-Scale Friction of a Tungsten Tip on a Graphite Surface" 59 : 1942-1945, 1987
14 "Atomic-Scale Friction Measurements Using Friction Force Microscopy: Part I - General Principles^New Measurement Techniques" 116 : 378-388, 1994
15 "Atomic Force Microscope" 56 : 930-933, 1986
16 "An Introduction to the Mechanics of Solids, 2nd ed." 393-395, 1978