RISS 학술연구정보서비스

검색
다국어 입력

http://chineseinput.net/에서 pinyin(병음)방식으로 중국어를 변환할 수 있습니다.

변환된 중국어를 복사하여 사용하시면 됩니다.

예시)
  • 中文 을 입력하시려면 zhongwen을 입력하시고 space를누르시면됩니다.
  • 北京 을 입력하시려면 beijing을 입력하시고 space를 누르시면 됩니다.
닫기
    인기검색어 순위 펼치기

    RISS 인기검색어

      KCI등재후보

      플럭스 활성도 및 In 첨가에 따른 Sn-0.3Ag-0.7Cu 솔더 조성의 젖음 특성 변화 = Wettability Evaluation of Sn-0.3Ag-0.7Cu Solder Alloy with Different Flux Activity and Indium Addition

      한글로보기

      https://www.riss.kr/link?id=A101205066

      • 0

        상세조회
      • 0

        다운로드
      서지정보 열기
      • 내보내기
      • 내책장담기
      • 공유하기
      • 오류접수

      부가정보

      다국어 초록 (Multilingual Abstract) kakao i 다국어 번역

      In this paper, wetting and interfacial reaction properties for low Ag containing Sn-Ag-Cu Pb-free solder alloy, i.e., Sn-0.3Ag-0.7Cu were investigated and compared with those of Sn-1.0Ag-0.5Cu and Sn-3.0Ag-0.5Cu. Melting behavior and stress-strain curves of some Sn-xAg-xCu alloys were also measured using a differential scanning calorimeter(DSC) and a tensile test machine, respectively. In order to enhance insufficient wetting properties of Sn-0.3Ag-0.7Cu alloy, the improvement of wetting properties were analyzed by applying fluxes containing higher content of halide or indium adding of 0.2wt.% into the solder alloy. It was concluded that the small addition of indium is more effective for the improvement of wettability in low temperature range of $230{\sim}240^{\circ}C$ than applying flux containing higher content of halide.
      번역하기

      In this paper, wetting and interfacial reaction properties for low Ag containing Sn-Ag-Cu Pb-free solder alloy, i.e., Sn-0.3Ag-0.7Cu were investigated and compared with those of Sn-1.0Ag-0.5Cu and Sn-3.0Ag-0.5Cu. Melting behavior and stress-strain cur...

      In this paper, wetting and interfacial reaction properties for low Ag containing Sn-Ag-Cu Pb-free solder alloy, i.e., Sn-0.3Ag-0.7Cu were investigated and compared with those of Sn-1.0Ag-0.5Cu and Sn-3.0Ag-0.5Cu. Melting behavior and stress-strain curves of some Sn-xAg-xCu alloys were also measured using a differential scanning calorimeter(DSC) and a tensile test machine, respectively. In order to enhance insufficient wetting properties of Sn-0.3Ag-0.7Cu alloy, the improvement of wetting properties were analyzed by applying fluxes containing higher content of halide or indium adding of 0.2wt.% into the solder alloy. It was concluded that the small addition of indium is more effective for the improvement of wettability in low temperature range of $230{\sim}240^{\circ}C$ than applying flux containing higher content of halide.

      더보기

      참고문헌 (Reference)

      1 "www.ecojoin.co.kr"

      2 M. J. Rizvi, "Wetting and Reaction of Sn- 2.8Ag-0.5Cu-1.0Bi Solder with Cu and Ni Substrates" 34 (34): 1115-1122, 2005

      3 "U.S. Patent No. 4,929,423"

      4 A-Mi Yu, "The Effect of the Addition of In on the Reaction and Mechanical Properties of Sn-1.0Ag-0.5Cu Solder Alloy" 대한금속ㆍ재료학회 13 (13): 517-520, 2007

      5 L. J. Turbini, "The Effect of Solder Paste Residues on RF Signal Integrity" 29 (29): 1164-1169, 2000

      6 W. J. Ready, "The Effect of Flux chemistry, Applied Voltage Conductor Spacing, and Temperature on Conductive Anodic Filament Formation" 31 (31): 1208-1224, 2002

      7 R. J. K. Wassink, "Soldering in Electronics" Electrochemical Publications Ltd. 1984

      8 이종현, "Reaction Properties and Interfacial Intermetallics for Sn-xAg-0.5Cu Solders as a Function of Ag Content" 대한금속·재료학회 14 (14): 649-654, 2008

      9 I. Ohnuma, "Phase Equilibria and the Related Properties of Sn-Ag-Cu Based Pbfree Solder Alloys" 29 (29): 1137-1144, 2000

      10 E. Bradley, "NEMI Report: A Single Lead-free Alloy is Recommended" 2003

      1 "www.ecojoin.co.kr"

      2 M. J. Rizvi, "Wetting and Reaction of Sn- 2.8Ag-0.5Cu-1.0Bi Solder with Cu and Ni Substrates" 34 (34): 1115-1122, 2005

      3 "U.S. Patent No. 4,929,423"

      4 A-Mi Yu, "The Effect of the Addition of In on the Reaction and Mechanical Properties of Sn-1.0Ag-0.5Cu Solder Alloy" 대한금속ㆍ재료학회 13 (13): 517-520, 2007

      5 L. J. Turbini, "The Effect of Solder Paste Residues on RF Signal Integrity" 29 (29): 1164-1169, 2000

      6 W. J. Ready, "The Effect of Flux chemistry, Applied Voltage Conductor Spacing, and Temperature on Conductive Anodic Filament Formation" 31 (31): 1208-1224, 2002

      7 R. J. K. Wassink, "Soldering in Electronics" Electrochemical Publications Ltd. 1984

      8 이종현, "Reaction Properties and Interfacial Intermetallics for Sn-xAg-0.5Cu Solders as a Function of Ag Content" 대한금속·재료학회 14 (14): 649-654, 2008

      9 I. Ohnuma, "Phase Equilibria and the Related Properties of Sn-Ag-Cu Based Pbfree Solder Alloys" 29 (29): 1137-1144, 2000

      10 E. Bradley, "NEMI Report: A Single Lead-free Alloy is Recommended" 2003

      11 J. S. Hwang, "Modern Solder Technology for Competitive Electronic Manufacturing" McGraw-Hill 1996

      12 M. Amagai, "High. Solder Joint Reliability with Lead Free. Solders" 317-322, 2003

      13 K. S. Kim, "Effects of Intermetallic Compounds on Properties of Sn–Ag–Cu Lead-free Soldered Joints" 352 : 226-236, 2003

      14 K. S. Kim, "Effects of Cooling Speed on Microstructure and Tensile Properties of Sn–Ag–Cu Alloys" A333 : 106 -, 2002

      15 S. Terashima, "Effect of Silver Content on Thermal Fatigue Life of Sn-xAg-0.5 Cu Flip-chip Interconnects" 32 (32): 1527-1533, 2003

      16 L. Wang, "Cross-section of Different Pad Finishes in SMT Joints and Its Effect on Board Level Reliability" 2007

      17 J. W. Evans, "A Guide to Lead-free Solders" Springer 2006

      더보기

      동일학술지(권/호) 다른 논문

      동일학술지 더보기

      더보기

      분석정보

      View

      상세정보조회

      0

      Usage

      원문다운로드

      0

      대출신청

      0

      복사신청

      0

      EDDS신청

      0

      동일 주제 내 활용도 TOP

      더보기

      주제

      연도별 연구동향

      연도별 활용동향

      연관논문

      연구자 네트워크맵

      공동연구자 (7)

      유사연구자 (20) 활용도상위20명

      인용정보 인용지수 설명보기

      학술지 이력

      학술지 이력
      연월일 이력구분 이력상세 등재구분
      2022 평가예정 계속평가 신청대상 (계속평가)
      2021-12-01 평가 등재후보로 하락 (재인증) KCI등재후보
      2018-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2015-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2011-06-28 학술지명변경 한글명 : 마이크전자 및 패키징학회지 -> 마이크로전자 및 패키징학회지
      외국어명 : The Microelectronics and Packaging Society -> Jornal of the Microelectronics and Packaging Society
      KCI등재
      2011-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2009-01-01 평가 등재 1차 FAIL (등재유지) KCI등재
      2007-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2004-01-01 평가 등재학술지 선정 (등재후보2차) KCI등재
      2003-01-01 평가 등재후보 1차 PASS (등재후보1차) KCI등재후보
      2001-07-01 평가 등재후보학술지 선정 (신규평가) KCI등재후보
      더보기

      학술지 인용정보

      학술지 인용정보
      기준연도 WOS-KCI 통합IF(2년) KCIF(2년) KCIF(3년)
      2016 0.48 0.48 0.43
      KCIF(4년) KCIF(5년) 중심성지수(3년) 즉시성지수
      0.39 0.35 0.299 0.35
      더보기

      이 자료와 함께 이용한 RISS 자료

      나만을 위한 추천자료

      해외이동버튼