1 김종안, "길이 표준 소급성을 갖는 원자간력 현미경을 이용한 2차원 격자 시편 측정과 불확도 평가" 한국정밀공학회 24 (24): 68-75, 2007
2 Felder,R, "Practical realization of the definition ofthe metre,including recommended radiations of otheroptical frequency standards(2003)" 42 (42): 323-325, 2005
3 Quinn,T.J, "Practical realization of the definition ofthe metre,including recommended radiations of otheroptical frequency standards(2001)" 40 (40): 103-133, 2003
4 진종한, "Pitch Measurement of 150 nm ID-grating Standards Using an Nanometrological Atomic Force Microscope" 한국정밀공학회 5 (5): 19-25, 2004
5 김종안, "Metrological Atomic Force Microscope Using a Large Range Scanning Dual Stage" 한국정밀공학회 10 (10): 11-17, 2009
6 ISO-5436-1(Type A) guideline, "International Organizationfor Standardization"
1 김종안, "길이 표준 소급성을 갖는 원자간력 현미경을 이용한 2차원 격자 시편 측정과 불확도 평가" 한국정밀공학회 24 (24): 68-75, 2007
2 Felder,R, "Practical realization of the definition ofthe metre,including recommended radiations of otheroptical frequency standards(2003)" 42 (42): 323-325, 2005
3 Quinn,T.J, "Practical realization of the definition ofthe metre,including recommended radiations of otheroptical frequency standards(2001)" 40 (40): 103-133, 2003
4 진종한, "Pitch Measurement of 150 nm ID-grating Standards Using an Nanometrological Atomic Force Microscope" 한국정밀공학회 5 (5): 19-25, 2004
5 김종안, "Metrological Atomic Force Microscope Using a Large Range Scanning Dual Stage" 한국정밀공학회 10 (10): 11-17, 2009
6 ISO-5436-1(Type A) guideline, "International Organizationfor Standardization"