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      KCI등재 SCIE SCOPUS

      Wavelet texture analysis in process industries

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      https://www.riss.kr/link?id=A104482863

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      다국어 초록 (Multilingual Abstract)

      Wavelet texture analysis has been applied to solve many problems in process industries as well as in other industries. In solving problems from process industries however, its potentials have never been explored to the full extent yet. This is not only because techniques used in wavelet texture analysis are still unfamiliar to researchers and practitioners in process industries, but also because characteristics of the scenes displayed by the images in process industries are difficult to analyze: products and processes in process industries mostly have stochastic outside appearance.
      The purpose of this article is to give an overview of state-of-the-art methods in wavelet texture analysis through an illustrative example from process industries.
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      Wavelet texture analysis has been applied to solve many problems in process industries as well as in other industries. In solving problems from process industries however, its potentials have never been explored to the full extent yet. This is not onl...

      Wavelet texture analysis has been applied to solve many problems in process industries as well as in other industries. In solving problems from process industries however, its potentials have never been explored to the full extent yet. This is not only because techniques used in wavelet texture analysis are still unfamiliar to researchers and practitioners in process industries, but also because characteristics of the scenes displayed by the images in process industries are difficult to analyze: products and processes in process industries mostly have stochastic outside appearance.
      The purpose of this article is to give an overview of state-of-the-art methods in wavelet texture analysis through an illustrative example from process industries.

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      참고문헌 (Reference)

      1 R.M. Haralick, 3 : 610-, 1973

      2 A. Biem, 45 : 500-, 1997

      3 B. Walczak, 38 (38): 39-, 1997

      4 M. Cocchi, 57 (57): 97-, 2001

      5 N. Kwak, 30 (30): 1672-, 2008

      6 R. A. Fisher, 7 (7): 179-, 1936

      7 J. J. Liu, 46 (46): 5152-, 2007

      8 A. Laine, 15 : 1186-, 1995

      9 S.G. Mallat, 11 : 674-, 1989

      10 Y. Mallet, 19 : 1058-, 1997

      1 R.M. Haralick, 3 : 610-, 1973

      2 A. Biem, 45 : 500-, 1997

      3 B. Walczak, 38 (38): 39-, 1997

      4 M. Cocchi, 57 (57): 97-, 2001

      5 N. Kwak, 30 (30): 1672-, 2008

      6 R. A. Fisher, 7 (7): 179-, 1936

      7 J. J. Liu, 46 (46): 5152-, 2007

      8 A. Laine, 15 : 1186-, 1995

      9 S.G. Mallat, 11 : 674-, 1989

      10 Y. Mallet, 19 : 1058-, 1997

      11 D. Kim, 48 (48): 2590-, 2009

      12 J. J. Liu, 18 (18): 65-, 2005

      13 J. J. Liu, 21 (21): 642-, 2008

      14 J. J. Liu, 16 (16): 374-, 2006

      15 J. J. Liu, 44 : 4687-, 2005

      16 S. Garcia-Munoz, 395 : 104-, 2010

      17 R. Gosselin, 2010

      18 M. S. Reis, 95 : 129-, 2009

      19 M. Bharati, 72 (72): 57-, 2004

      20 B. Julesz, 232 (232): 34-, 1975

      21 R. P.W. Duin, 23 : 762-, 2001

      22 D. C. He, 25 : 391-, 1991

      23 C. Sun, 23 : 341-, 1983

      24 G. Cross, 5 : 25-, 1983

      25 J. M. Keller, 45 : 150-, 1989

      26 T. Chang, 2 : 429-, 1993

      27 K. Etdmad, 7 : 1453-, 1998

      28 J.G. Daugman, "in Computational Neuroscience" MIT Press 1988

      29 G. Van De Wouer, "Wavelets for multiscale texture analysis" University of Antwerp 1998

      30 M. Vetterli, "Wavelets and subband coding" Prentice Hall 1995

      31 M. D. Levine, "Vision in man and machine" McGraw-Hill Inc 1985

      32 J. J. Liu, "Machine vision for process industries: Monitoring, control and optimization of visual quality of processes and products" McMaster University 2004

      33 S. Livens, "Image analysis for material characterization" University of Antwerp 1998

      34 "IEEE Standard 610.4"

      35 M. Tuceryan, "Handbook of pattern recognition and computer vision" World Scientific Publishing 1998

      36 T. Randen, "Filter and filter bank design for image texture recognition" NTNU 1997

      37 R.C. Gonzalez, "Digital image processing" Addison- Wesley 1993

      38 A. Materka, "COST B11 Report, Technical University of Lodz" Institute of Electronics 1998

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      학술지 이력

      학술지 이력
      연월일 이력구분 이력상세 등재구분
      2023 평가예정 해외DB학술지평가 신청대상 (해외등재 학술지 평가)
      2020-01-01 평가 등재학술지 유지 (해외등재 학술지 평가) KCI등재
      2016-06-21 학술지명변경 한글명 : The Korean Journal of Chemical Engineering -> Korean Journal of Chemical Engineering
      외국어명 : The Korean Journal of Chemical Engineering -> Korean Journal of Chemical Engineering
      KCI등재
      2011-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2009-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2007-09-27 학회명변경 영문명 : The Korean Institute Of Chemical Engineers -> The Korean Institute of Chemical Engineers KCI등재
      2007-09-03 학술지명변경 한글명 : The Korean Journal of Chemical Engineeri -> The Korean Journal of Chemical Engineering
      외국어명 : The Korean Journal of Chemical Engineeri -> The Korean Journal of Chemical Engineering
      KCI등재
      2007-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2005-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2002-01-01 평가 등재학술지 선정 (등재후보2차) KCI등재
      1999-07-01 평가 등재후보학술지 선정 (신규평가) KCI등재후보
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      학술지 인용정보

      학술지 인용정보
      기준연도 WOS-KCI 통합IF(2년) KCIF(2년) KCIF(3년)
      2016 1.92 0.72 1.4
      KCIF(4년) KCIF(5년) 중심성지수(3년) 즉시성지수
      1.15 0.94 0.403 0.14
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