1 Baik, J. H., "Vision of Solar Cell Technology" KISTI 21-35, 2005
2 Martina, C., "Multi-level Counters for Single-phase Grid Connected Photovoltaic System" 66 (66): 325-335, 1999
3 Tobin, K. W., "Inspection in Semiconductor Manufacturing, Webster's Encyclopedia of Electrical and Electronic Engineering" Wiley & Sons 242-263, 1996
4 Funck, J. W., "Image Segmentation Algorithms Applied to Wood Defect Detection" 41 (41): 157-179, 2003
5 Park, H. J., "Dimension Measurement using the Machine Vision" 18 (18): 91-99, 2001
6 Dana, H., "Computer Vision" Prentice Hall 1982
7 Chou, P. B., "Automatic Defect Classification for Semiconductor Manufacturing" 9 (9): 201-207, 1997
8 Boukharouha, S., "An Amplitude Method Based on the Distribution Function of an image" 29 (29): 47-59, 1985
1 Baik, J. H., "Vision of Solar Cell Technology" KISTI 21-35, 2005
2 Martina, C., "Multi-level Counters for Single-phase Grid Connected Photovoltaic System" 66 (66): 325-335, 1999
3 Tobin, K. W., "Inspection in Semiconductor Manufacturing, Webster's Encyclopedia of Electrical and Electronic Engineering" Wiley & Sons 242-263, 1996
4 Funck, J. W., "Image Segmentation Algorithms Applied to Wood Defect Detection" 41 (41): 157-179, 2003
5 Park, H. J., "Dimension Measurement using the Machine Vision" 18 (18): 91-99, 2001
6 Dana, H., "Computer Vision" Prentice Hall 1982
7 Chou, P. B., "Automatic Defect Classification for Semiconductor Manufacturing" 9 (9): 201-207, 1997
8 Boukharouha, S., "An Amplitude Method Based on the Distribution Function of an image" 29 (29): 47-59, 1985