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      KCI등재 SCOPUS SCIE

      Properties of Cu2ZnSn(SxSe1x)4 thin films prepared by one-step sulfo-selenization of alloyed metal precursors

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      https://www.riss.kr/link?id=A104123541

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      다국어 초록 (Multilingual Abstract)

      The pentenary system, Cu2ZnSn(SxSe1x)4 (CZTSSe), is a promising alternative for thin film solar cells. In this study, CZTSSe thin films were prepared using a two-stage process involving the thermal diffusion of sulfur (S) and selenium (Se) vapors into sputtered metallic precursors at approximately 450 C. The effects of the sulfur content on the composition, structure, optical and electrical characteristics of the CZTSSe thin films were investigated. The films showed a kesterite structure with a predominant (112) orientation. X-ray diffraction and Raman spectroscopy confirmed the formation of a single phase CZTSSe compound. The band gap was dependent on the sulfur content and was calculated to be 1.25 eV, 1.33 eV and 1.40 eV for CZTSSe films with a S/(S þ Se) ratio of 0.3, 0.5 and 0.7, respectively. All films exhibited ptype semiconductor properties.
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      The pentenary system, Cu2ZnSn(SxSe1x)4 (CZTSSe), is a promising alternative for thin film solar cells. In this study, CZTSSe thin films were prepared using a two-stage process involving the thermal diffusion of sulfur (S) and selenium (Se) vapors into...

      The pentenary system, Cu2ZnSn(SxSe1x)4 (CZTSSe), is a promising alternative for thin film solar cells. In this study, CZTSSe thin films were prepared using a two-stage process involving the thermal diffusion of sulfur (S) and selenium (Se) vapors into sputtered metallic precursors at approximately 450 C. The effects of the sulfur content on the composition, structure, optical and electrical characteristics of the CZTSSe thin films were investigated. The films showed a kesterite structure with a predominant (112) orientation. X-ray diffraction and Raman spectroscopy confirmed the formation of a single phase CZTSSe compound. The band gap was dependent on the sulfur content and was calculated to be 1.25 eV, 1.33 eV and 1.40 eV for CZTSSe films with a S/(S þ Se) ratio of 0.3, 0.5 and 0.7, respectively. All films exhibited ptype semiconductor properties.

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      참고문헌 (Reference)

      1 D. B. Mitzi, 95 : 1421-1436, 2011

      2 A. A. I. Al-Bassam, 62 : 175-178, 2000

      3 M. I. Amal, 24 : 559-566, 2013

      4 T. K. Todorov, 3 : 34-38, 2013

      5 K. Timmo, 94 : 1889-1892, 2010

      6 A. Redinger, 535 : 291-295, 2013

      7 R. Lechner, 535 : 5-9, 2013

      8 Q. Guo, 132 : 17384-17386, 2010

      9 T. Schnabel, 117 : 324-328, 2013

      10 M. Altosaar, 205 : 167-170, 2008

      1 D. B. Mitzi, 95 : 1421-1436, 2011

      2 A. A. I. Al-Bassam, 62 : 175-178, 2000

      3 M. I. Amal, 24 : 559-566, 2013

      4 T. K. Todorov, 3 : 34-38, 2013

      5 K. Timmo, 94 : 1889-1892, 2010

      6 A. Redinger, 535 : 291-295, 2013

      7 R. Lechner, 535 : 5-9, 2013

      8 Q. Guo, 132 : 17384-17386, 2010

      9 T. Schnabel, 117 : 324-328, 2013

      10 M. Altosaar, 205 : 167-170, 2008

      11 H. Araki, 517 : 1457-1460, 2008

      12 P. M. P. Salome, 101 : 147-153, 2012

      13 J. J. Scragg, 13 : 3035-3046, 2012

      14 R. A. Wibowo, 535 : 57-61, 2013

      15 Y. Yamamoto, 281 : 372-374, 1996

      16 M. I. Amal, 9 : 345-353, 2012

      17 유혜선, "Sulfurization temperature effects on the growth of Cu2ZnSnS4 thin film" 한국물리학회 12 (12): 1052-1057, 2012

      18 Ryo Ishino, "Improvement of Cu2ZnSnS4 thin film morphology using Cu-Zn-Sn-O precursor fabricated by sputtering" 한국물리학회 13 (13): 1861-1864, 2013

      19 S.M. Pawar, "Effect of laser incident energy on the structural, morphological and optical properties of Cu2ZnSnS4 (CZTS) thin films" 한국물리학회 10 (10): 565-569, 2010

      20 Seung Wook Shin, "Band gap tunable and improved microstructure characteristics of Cu2ZnSn(S1-x,Sex)4 thin films by annealing under atmosphere containing S and Se" 한국물리학회 13 (13): 1837-1843, 2013

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      학술지 이력

      학술지 이력
      연월일 이력구분 이력상세 등재구분
      2023 평가예정 해외DB학술지평가 신청대상 (해외등재 학술지 평가)
      2020-01-01 평가 등재학술지 유지 (해외등재 학술지 평가) KCI등재
      2008-01-01 평가 등재학술지 선정 (등재후보2차) KCI등재
      2007-01-01 평가 등재후보 1차 PASS (등재후보1차) KCI등재후보
      2003-01-01 평가 등재후보학술지 선정 (신규평가) KCI등재후보
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      기준연도 WOS-KCI 통합IF(2년) KCIF(2년) KCIF(3년)
      2016 1.8 0.18 1.17
      KCIF(4년) KCIF(5년) 중심성지수(3년) 즉시성지수
      0.92 0.77 0.297 0.1
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