1 K. Mori, 4 : 50-, 1996
2 C. C. Chen, NS-39 : 272-, 1992
3 H. S. Kim, 35 : 2-, 2010
4 T. H. Lee, 579 : 260-, 2007
5 "ToshibaTM datasheet"
6 G. C. Messenger, "The effects of Radiation on Electronic Systems" Van Nostrand Reinhold 1986
7 "NECTM datasheet"
8 T. P. Ma, "Ionizing Radiation Effects in MOS Devices and Circuits" Wiley & Sons 1989
9 A. Holmes-Siedle, "Handbook of Radiation Effects" Oxford University Press 1993
10 L. W. Ricketts, "Fundamentals of Nuclear Hardening of Electronic Equipment" Robert E. Krieger Publishing Company 1986
1 K. Mori, 4 : 50-, 1996
2 C. C. Chen, NS-39 : 272-, 1992
3 H. S. Kim, 35 : 2-, 2010
4 T. H. Lee, 579 : 260-, 2007
5 "ToshibaTM datasheet"
6 G. C. Messenger, "The effects of Radiation on Electronic Systems" Van Nostrand Reinhold 1986
7 "NECTM datasheet"
8 T. P. Ma, "Ionizing Radiation Effects in MOS Devices and Circuits" Wiley & Sons 1989
9 A. Holmes-Siedle, "Handbook of Radiation Effects" Oxford University Press 1993
10 L. W. Ricketts, "Fundamentals of Nuclear Hardening of Electronic Equipment" Robert E. Krieger Publishing Company 1986
11 "Fairchild semiconductorTM datasheet"
12 "Analog Devices Inc. datasheet"