1 Yamamoto, A., "Surface profilometry by wavelength scanning Fizeau interferometer" 32 (32): 261-266, 2000
2 Kunzmann, H, "Scales vs. laser interferometers, performance and comparison of two measuring systems" 42 (42): 753-767, 1993
3 Schwenke, H, "Optical methods for Dimensional Metrology in Production Engineering" 51 (51): 685-699, 2002
4 Nomura, T., "Onmachine shape measurement of workpiece surface with Fizeau interferometer" 14 (14): 155-159, 1992
5 Chatterjee, S., "Measurement of surface figure of plane optical surfaces with polarization phaseshifting Fizeau interferometer" 39 (39): 268-274, 2007
6 Zygo Corporation, "Fizeau interferometer Catalogue"
7 Bünnagel, R, "Fizeau Interferometer for Measuring the Flatness of Optical Surfaces" 7 (7): 331-335, 1968
8 Bhattacharyya, D, "Direct measurement on transparent plates by using Fizeauinterferometry" 34 (34): 93-96, 2002
9 박재성, "Development of straightness measurement technique using the profile matching method" Elsevier 37 (37): 135-147, 199702
10 Kimura, A., "Design and construction of a two-degree-of-freedom linear encoder for nanometric measurement of stage position and straightness" 34 (34): 145-155, 2010
1 Yamamoto, A., "Surface profilometry by wavelength scanning Fizeau interferometer" 32 (32): 261-266, 2000
2 Kunzmann, H, "Scales vs. laser interferometers, performance and comparison of two measuring systems" 42 (42): 753-767, 1993
3 Schwenke, H, "Optical methods for Dimensional Metrology in Production Engineering" 51 (51): 685-699, 2002
4 Nomura, T., "Onmachine shape measurement of workpiece surface with Fizeau interferometer" 14 (14): 155-159, 1992
5 Chatterjee, S., "Measurement of surface figure of plane optical surfaces with polarization phaseshifting Fizeau interferometer" 39 (39): 268-274, 2007
6 Zygo Corporation, "Fizeau interferometer Catalogue"
7 Bünnagel, R, "Fizeau Interferometer for Measuring the Flatness of Optical Surfaces" 7 (7): 331-335, 1968
8 Bhattacharyya, D, "Direct measurement on transparent plates by using Fizeauinterferometry" 34 (34): 93-96, 2002
9 박재성, "Development of straightness measurement technique using the profile matching method" Elsevier 37 (37): 135-147, 199702
10 Kimura, A., "Design and construction of a two-degree-of-freedom linear encoder for nanometric measurement of stage position and straightness" 34 (34): 145-155, 2010
11 Gao, W, "A fast evaluation method for pitch deviation and flatness of a planar scale grating" 59 (59): 509-508, 2010
12 Fairman, P. S., "300-mm-aperture phase-shifting Fizeau interferometer" 38 (38): 1371-1380, 1999