<P>We present the noble sensing method that can simultaneously measure the physical thickness and the refractive index of a transparent specimen based on full-field optical coherence microscopy. As a sample, a small drop of epoxy was placed on a...
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https://www.riss.kr/link?id=A107592405
2009
-
SCIE,SCOPUS
학술저널
1996-1997(2쪽)
0
상세조회0
다운로드다국어 초록 (Multilingual Abstract)
<P>We present the noble sensing method that can simultaneously measure the physical thickness and the refractive index of a transparent specimen based on full-field optical coherence microscopy. As a sample, a small drop of epoxy was placed on a...
<P>We present the noble sensing method that can simultaneously measure the physical thickness and the refractive index of a transparent specimen based on full-field optical coherence microscopy. As a sample, a small drop of epoxy was placed on a flat glass plate and high-resolution depth resolved en-face images were taken. With adopting the reference plane from a cross-sectional image, the physical thickness, and the refractive index distribution could be obtained.</P>