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      KCI등재 SCIE SCOPUS

      Capacitance Swing and Capacitance Ratio of GaN-Based Metal-Semiconductor-Metal Two-Dimensional Electron Gas Varactor with Different Dielectric Films

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      https://www.riss.kr/link?id=A100540856

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      다국어 초록 (Multilingual Abstract)

      The performance of the AlGaN/GaN MSM-2DEG varactor with different dielectric films deposited by the E-beam deposition is investigated in detail. The capacitance swing and the capacitance ratio of the varactor without dielectric film as well as with, S...

      The performance of the AlGaN/GaN MSM-2DEG varactor with different dielectric films deposited by the E-beam deposition is investigated in detail. The capacitance swing and the capacitance ratio of the varactor without dielectric film as well as with, SiO2, Gd2O3, and Si3N4 films, respectively, are determined by electrodes of varying areas. The maximum capacitance, the minimum capacitance and the capacitance ratios are proportional to the increasing of the electrode areas. The capacitance ratio determined by the maximum and the minimum capacitance is found to be 18.35 (with Si3N4 dielectric film) and 149.51 (without dielectric film), respectively. The transition voltages of the fabricated varactors are almost the same for a bias voltage of about ±5 V and leakage current can be lower three orders of magnitude while the varactors with dielectric films. The tunability of the capacitance ratio makes the AlGaN/GaN MSM-2DEG varactor with a dielectric film highly useful in multirange applications of a surge free preamplier.

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      목차 (Table of Contents)

      • Abstract
      • 1. Introduction
      • 2. Experiment
      • 3. Results and Discussion
      • 4. Summary and Conclusions
      • Abstract
      • 1. Introduction
      • 2. Experiment
      • 3. Results and Discussion
      • 4. Summary and Conclusions
      • References
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      참고문헌 (Reference)

      1 M. Marso, "Varactor Diodes based on an AlGaNGaN HEMT layer structure" 37-42, 2001

      2 B. M. Green, "The effect of surface passivation on the microwave characteristics of undoped AlGaN/GaN HEMTs" 21 : 268-270, 2000

      3 Manju Gupta, "The Preparation, Properties and Applications of Silicon Nitride Thin Films Deposited by Plasma-Eehanced Chemical Vapor Deposition" 204 : 77-106, 1991

      4 X. Hu, "Si3N4/AlGaN/GaN–Metal-Insulator-Semiconductor Heterostructure Field Effect Transistors" 79 : 2832-2834, 2001

      5 C. S. Chu, "QFactor Characterization of RF GaN-Based Metal–Semiconductor–Metal Planar Interdigitated Varactor" 26 : 432-434, 2005

      6 M. A. Frerking, "Novel Heterojunction Varactors" 80 : 1853-1860, 1992

      7 Ho Won Jang, "Mechanism of twodimensional electron gas formation in AlxGa1-xN/GaN heterostructures" 81 (81): 1249-1251, 2002

      8 M. Marso, "MSM Diodes Based on an AlGaN/GaN HEMT Laycr Structure for Varactor and Photodiode Application" 295-298, 2002

      9 A. Koudymov, "Low-loss high power RF switching using multifinger AlGaN/GaN MOSHFETs" 23 : 449-451, 2002

      10 Y. C. Ferng, "Improvement of Surge Protection by Using an AlGaN/GaN-Based Metal–Semiconductor–Metal Two-Dimensional Electron Gas Varactor" 51 : 124201-1-124201-4, 2012

      1 M. Marso, "Varactor Diodes based on an AlGaNGaN HEMT layer structure" 37-42, 2001

      2 B. M. Green, "The effect of surface passivation on the microwave characteristics of undoped AlGaN/GaN HEMTs" 21 : 268-270, 2000

      3 Manju Gupta, "The Preparation, Properties and Applications of Silicon Nitride Thin Films Deposited by Plasma-Eehanced Chemical Vapor Deposition" 204 : 77-106, 1991

      4 X. Hu, "Si3N4/AlGaN/GaN–Metal-Insulator-Semiconductor Heterostructure Field Effect Transistors" 79 : 2832-2834, 2001

      5 C. S. Chu, "QFactor Characterization of RF GaN-Based Metal–Semiconductor–Metal Planar Interdigitated Varactor" 26 : 432-434, 2005

      6 M. A. Frerking, "Novel Heterojunction Varactors" 80 : 1853-1860, 1992

      7 Ho Won Jang, "Mechanism of twodimensional electron gas formation in AlxGa1-xN/GaN heterostructures" 81 (81): 1249-1251, 2002

      8 M. Marso, "MSM Diodes Based on an AlGaN/GaN HEMT Laycr Structure for Varactor and Photodiode Application" 295-298, 2002

      9 A. Koudymov, "Low-loss high power RF switching using multifinger AlGaN/GaN MOSHFETs" 23 : 449-451, 2002

      10 Y. C. Ferng, "Improvement of Surge Protection by Using an AlGaN/GaN-Based Metal–Semiconductor–Metal Two-Dimensional Electron Gas Varactor" 51 : 124201-1-124201-4, 2012

      11 P. Kordoš, "High-power SiO2/AlGaN/GaN metal-oxide-semiconductor heterostructure fieldeffect transistors" 87 : 143501-1-143501-3, 2005

      12 G. Simin, "High-Power RF Switching Using III-Nitride Metal–Oxide–Semiconductor Heterojunction Capacitors" 26 : 56-58, 2005

      13 R. Lupták, "Growth of gadolinium oxide films for advanced MOS structure" 80 : 154-157, 2005

      14 P. D. Ye, "GaN metal-oxidesemiconductor high-electron-mobility-transistor with atomic layer deposited Al2O3 as gate dielectric" 86 : 063501-1-063501-3, 2005

      15 M. Marso, "Electrical Behaviour of The InP/InGaAs Based MSM-2DEG Diode" 41 (41): 25-31, 1997

      16 M. Marso, "Comparison of AlGaN/GaN MSM Varactor Diodes Based on HFET and MOSHFET Layer Structures" 27 : 945-947, 2006

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      학술지 이력

      학술지 이력
      연월일 이력구분 이력상세 등재구분
      학술지등록 한글명 : Journal of Electrical Engineering & Technology(JEET)
      외국어명 : Journal of Electrical Engineering & Technology
      2023 평가예정 해외DB학술지평가 신청대상 (해외등재 학술지 평가)
      2020-01-01 평가 등재학술지 유지 (해외등재 학술지 평가) KCI등재
      2011-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2009-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2006-01-01 평가 학술지 통합 (기타) KCI등재
      2006-01-01 평가 등재학술지 선정 (등재후보2차) KCI등재
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      학술지 인용정보

      학술지 인용정보
      기준연도 WOS-KCI 통합IF(2년) KCIF(2년) KCIF(3년)
      2016 0.45 0.21 0.39
      KCIF(4년) KCIF(5년) 중심성지수(3년) 즉시성지수
      0.37 0.34 0.372 0.04
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