RISS 학술연구정보서비스

검색
다국어 입력

http://chineseinput.net/에서 pinyin(병음)방식으로 중국어를 변환할 수 있습니다.

변환된 중국어를 복사하여 사용하시면 됩니다.

예시)
  • 中文 을 입력하시려면 zhongwen을 입력하시고 space를누르시면됩니다.
  • 北京 을 입력하시려면 beijing을 입력하시고 space를 누르시면 됩니다.
닫기
    인기검색어 순위 펼치기

    RISS 인기검색어

      KCI등재

      채널길이에 대한 비대칭 이중게이트 MOSFET의 문턱전압이하 스윙 분석 = Analysis of Subthreshold Swing for Channel Length of Asymmetric Double Gate MOSFET

      한글로보기

      https://www.riss.kr/link?id=A101325277

      • 0

        상세조회
      • 0

        다운로드
      서지정보 열기
      • 내보내기
      • 내책장담기
      • 공유하기
      • 오류접수

      부가정보

      다국어 초록 (Multilingual Abstract)

      The change of subthreshold swing for channel length of asymmetric double gate(DG) MOSFET has been analyzed. The subthreshold swing is the important factor to determine digital chracteristics of transistor and is degraded with reduction of channel. The subthreshold swing for channel length of the DGMOSFET developed to solve this problem is investigated for channel thickness, oxide thickness, top and bottom gate voltage and doping concentration. Especially the subthreshold swing for asymmetric DGMOSFET to be able to be fabricated with different top and bottom gate structure is investigated in detail for bottom gate voltage and bottom oxide thickness. To obtain the analytical subthreshold swing, the analytical potential distribution is derived from Possion's equation, and Gaussian distribution function is used as doping profile. As a result, subthreshold swing is sensitively changed according to top and bottom gate voltage, channel doping concentration and channel dimension.
      번역하기

      The change of subthreshold swing for channel length of asymmetric double gate(DG) MOSFET has been analyzed. The subthreshold swing is the important factor to determine digital chracteristics of transistor and is degraded with reduction of channel. The...

      The change of subthreshold swing for channel length of asymmetric double gate(DG) MOSFET has been analyzed. The subthreshold swing is the important factor to determine digital chracteristics of transistor and is degraded with reduction of channel. The subthreshold swing for channel length of the DGMOSFET developed to solve this problem is investigated for channel thickness, oxide thickness, top and bottom gate voltage and doping concentration. Especially the subthreshold swing for asymmetric DGMOSFET to be able to be fabricated with different top and bottom gate structure is investigated in detail for bottom gate voltage and bottom oxide thickness. To obtain the analytical subthreshold swing, the analytical potential distribution is derived from Possion's equation, and Gaussian distribution function is used as doping profile. As a result, subthreshold swing is sensitively changed according to top and bottom gate voltage, channel doping concentration and channel dimension.

      더보기

      참고문헌 (Reference)

      1 정학기, "급수함수를 이용한 비대칭 이중게이트 MOSFET의 전위분포 분석" 한국정보통신학회 17 (17): 2621-2626, 2013

      2 N. Seoane, "Random Dopant, Line-Edge Roughness and Gate Workfunction Variability in a Nano InGaAs FinFETs" 61 (61): 466-472, 2006

      3 S. Dimitrijev, "Principles of Semiconductor Devices" Oxford University Press 2012

      4 J. B. Roldan, "In-depth analysis and modelling of self-heating effects in nanometric DGMOSFETs" 79 (79): 179-184, 2013

      5 R. Vaddi, "Analytical modeling of subthreshold current and subthreshold swing of an underlap DGMOSFET with tied independent gate and symmetric asymmetric options" 42 (42): 798-807, 2011

      6 Z. Ding, "An analytical model for channel potential and subthreshold swing of the symmetric and asymmetric double-gate MOSFETs" 42 : 515-519, 2011

      7 J. P. Duarte, "A nonpiecewise model for long-channel junctionless cylindrical nanowire FETs" 33 (33): 155-157, 2012

      8 P. K. Tiwari, "A 2D Analytical Model of the Channel Potential and Threshold Voltage of Double-Gate(DG)MOSFETs With Vertical Gaussian Doping Profile" 52-55, 2009

      1 정학기, "급수함수를 이용한 비대칭 이중게이트 MOSFET의 전위분포 분석" 한국정보통신학회 17 (17): 2621-2626, 2013

      2 N. Seoane, "Random Dopant, Line-Edge Roughness and Gate Workfunction Variability in a Nano InGaAs FinFETs" 61 (61): 466-472, 2006

      3 S. Dimitrijev, "Principles of Semiconductor Devices" Oxford University Press 2012

      4 J. B. Roldan, "In-depth analysis and modelling of self-heating effects in nanometric DGMOSFETs" 79 (79): 179-184, 2013

      5 R. Vaddi, "Analytical modeling of subthreshold current and subthreshold swing of an underlap DGMOSFET with tied independent gate and symmetric asymmetric options" 42 (42): 798-807, 2011

      6 Z. Ding, "An analytical model for channel potential and subthreshold swing of the symmetric and asymmetric double-gate MOSFETs" 42 : 515-519, 2011

      7 J. P. Duarte, "A nonpiecewise model for long-channel junctionless cylindrical nanowire FETs" 33 (33): 155-157, 2012

      8 P. K. Tiwari, "A 2D Analytical Model of the Channel Potential and Threshold Voltage of Double-Gate(DG)MOSFETs With Vertical Gaussian Doping Profile" 52-55, 2009

      더보기

      동일학술지(권/호) 다른 논문

      동일학술지 더보기

      더보기

      분석정보

      View

      상세정보조회

      0

      Usage

      원문다운로드

      0

      대출신청

      0

      복사신청

      0

      EDDS신청

      0

      동일 주제 내 활용도 TOP

      더보기

      주제

      연도별 연구동향

      연도별 활용동향

      연관논문

      연구자 네트워크맵

      공동연구자 (7)

      유사연구자 (20) 활용도상위20명

      인용정보 인용지수 설명보기

      학술지 이력

      학술지 이력
      연월일 이력구분 이력상세 등재구분
      2027 평가예정 재인증평가 신청대상 (재인증)
      2021-01-01 평가 등재학술지 유지 (재인증) KCI등재
      2018-01-01 평가 등재학술지 선정 (계속평가) KCI등재
      2017-12-01 평가 등재후보로 하락 (계속평가) KCI등재후보
      2013-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2011-11-23 학술지명변경 외국어명 : THE JOURNAL OF The KOREAN Institute Of Maritime information & Communication Science -> Journal of the Korea Institute Of Information and Communication Engineering KCI등재
      2011-11-16 학회명변경 영문명 : International Journal of Information and Communication Engineering(IJICE) -> The Korea Institute of Information and Communication Engineering KCI등재
      2011-11-14 학회명변경 한글명 : 한국해양정보통신학회 -> 한국정보통신학회
      영문명 : 미등록 -> International Journal of Information and Communication Engineering(IJICE)
      KCI등재
      2010-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2008-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2005-01-01 평가 등재학술지 선정 (등재후보2차) KCI등재
      2004-01-01 평가 등재후보 1차 PASS (등재후보1차) KCI등재후보
      2002-07-01 평가 등재후보학술지 선정 (신규평가) KCI등재후보
      더보기

      학술지 인용정보

      학술지 인용정보
      기준연도 WOS-KCI 통합IF(2년) KCIF(2년) KCIF(3년)
      2016 0.23 0.23 0.27
      KCIF(4년) KCIF(5년) 중심성지수(3년) 즉시성지수
      0.24 0.22 0.424 0.11
      더보기

      이 자료와 함께 이용한 RISS 자료

      나만을 위한 추천자료

      해외이동버튼