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      KCI등재 SCI SCIE SCOPUS

      Langmuir Probe Perturbation in Inductively Coupled Plasmas

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      https://www.riss.kr/link?id=A104335714

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      다국어 초록 (Multilingual Abstract) kakao i 다국어 번역

      For radial plasma density profile measurements, Langmuir probes are usually used. In this paper,
      a Langmuir probe was located at 4 cm below a dielectric window and the measurement was
      performed at 25 mTorr of argon at various rf powers (13.56 MHz). We found that the radial plasma
      density distributions became asymmetric as the rf power increases. To investigate the cause of this
      asymmetric density distribution, we installed a floating probe that can measure plasma densities
      and the electron temperatures in real time on the chamber wall. At high rf powers, as the probe
      body went in, the plasma density measured by the floating probe decreased. This indicates that
      the entire plasma density is affected by the probe intrusion. It appears that the Langmuir probe
      passes through the skin layer and the probe body impedes the electron heating process in the skin
      layer. As a solution, a probe body shape to avoid this perturbation is presented.
      번역하기

      For radial plasma density profile measurements, Langmuir probes are usually used. In this paper, a Langmuir probe was located at 4 cm below a dielectric window and the measurement was performed at 25 mTorr of argon at various rf powers (13.56 MHz). ...

      For radial plasma density profile measurements, Langmuir probes are usually used. In this paper,
      a Langmuir probe was located at 4 cm below a dielectric window and the measurement was
      performed at 25 mTorr of argon at various rf powers (13.56 MHz). We found that the radial plasma
      density distributions became asymmetric as the rf power increases. To investigate the cause of this
      asymmetric density distribution, we installed a floating probe that can measure plasma densities
      and the electron temperatures in real time on the chamber wall. At high rf powers, as the probe
      body went in, the plasma density measured by the floating probe decreased. This indicates that
      the entire plasma density is affected by the probe intrusion. It appears that the Langmuir probe
      passes through the skin layer and the probe body impedes the electron heating process in the skin
      layer. As a solution, a probe body shape to avoid this perturbation is presented.

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      참고문헌 (Reference)

      1 K. C. Leou, 38 : 4268-, 1999

      2 V. A. Godyak, 3 : 169-, 1994

      3 I. Langmuir, 27 : 449-, 1924

      4 M. Sarfaty, 69 : 3176-, 1998

      5 J. Hopwood, 3 : 460-, 1994

      6 J. A. Boedo, 69 : 2663-, 1998

      7 V. A. Godyak, 1 : 36-, 1992

      8 V. A. Godyak, 11 : 525-, 2002

      9 M. H. Lee, 101 : 33305-, 2007

      10 J. A. Boedo, 70 : 2997-, 1999

      1 K. C. Leou, 38 : 4268-, 1999

      2 V. A. Godyak, 3 : 169-, 1994

      3 I. Langmuir, 27 : 449-, 1924

      4 M. Sarfaty, 69 : 3176-, 1998

      5 J. Hopwood, 3 : 460-, 1994

      6 J. A. Boedo, 69 : 2663-, 1998

      7 V. A. Godyak, 1 : 36-, 1992

      8 V. A. Godyak, 11 : 525-, 2002

      9 M. H. Lee, 101 : 33305-, 2007

      10 J. A. Boedo, 70 : 2997-, 1999

      11 J. H. Keller, 5 : 166-, 1996

      12 C. W. Chung, 80 : 1725-, 2002

      13 H. Conrads, 9 : 441-, 2000

      14 J. Hopwood, 1 : 109-, 1992

      15 M. A. Liebermann, "in Principles of Plasma Discharges and Material Processing" Wiley 1994

      16 F. F. Chen, "in Plasma Diagnostic Technique, edited by R. H. Huddlestone" Academic 1968

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      학술지 이력

      학술지 이력
      연월일 이력구분 이력상세 등재구분
      2023 평가예정 해외DB학술지평가 신청대상 (해외등재 학술지 평가)
      2020-01-01 평가 등재학술지 유지 (해외등재 학술지 평가) KCI등재
      2011-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2009-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2007-01-01 평가 SCI 등재 (등재유지) KCI등재
      2005-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2002-07-01 평가 등재학술지 선정 (등재후보2차) KCI등재
      2000-01-01 평가 등재후보학술지 선정 (신규평가) KCI등재후보
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      학술지 인용정보

      학술지 인용정보
      기준연도 WOS-KCI 통합IF(2년) KCIF(2년) KCIF(3년)
      2016 0.47 0.15 0.31
      KCIF(4년) KCIF(5년) 중심성지수(3년) 즉시성지수
      0.26 0.2 0.26 0.03
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