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      KCI등재 SCOPUS

      Photoluminescence Studies of InP/InGaP Quantum Structures Grown by a Migration Enhanced Molecular Beam Epitaxy

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      https://www.riss.kr/link?id=A103674489

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      다국어 초록 (Multilingual Abstract)

      InP/InGaP quantum structures (QSs) grown on GaAs substrates by a migration-enhanced molecular beam epitaxy method were studied as a function of growth temperature (T) using photoluminescence (PL) and emissionwavelength- dependent time-resolved PL (TRPL). The growth T were varied from 440℃ to 520℃ for the formation of InP/InGaP QSs. As growth T increases from 440℃ to 520℃, the PL peak position is blue-shifted, the PL intensity increases except for the sample grown at 520℃, and the PL decay becomes fast at 10 K. Emission-wavelengthdependent TRPL results of all QS samples show that the decay times at 10 K are slightly changed, exhibiting the longest time around at the PL peak, while at high T, the decay times increase rapidly with increasing wavelength, indicating carrier relaxation from smaller QSs to larger QSs via wetting layer/barrier. InP/InGaP QS sample grown at 460℃ shows the strongest PL intensity at 300 K and the longest decay time at 10 K, signifying the optimum growth T of 460℃.
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      InP/InGaP quantum structures (QSs) grown on GaAs substrates by a migration-enhanced molecular beam epitaxy method were studied as a function of growth temperature (T) using photoluminescence (PL) and emissionwavelength- dependent time-resolved PL (TRP...

      InP/InGaP quantum structures (QSs) grown on GaAs substrates by a migration-enhanced molecular beam epitaxy method were studied as a function of growth temperature (T) using photoluminescence (PL) and emissionwavelength- dependent time-resolved PL (TRPL). The growth T were varied from 440℃ to 520℃ for the formation of InP/InGaP QSs. As growth T increases from 440℃ to 520℃, the PL peak position is blue-shifted, the PL intensity increases except for the sample grown at 520℃, and the PL decay becomes fast at 10 K. Emission-wavelengthdependent TRPL results of all QS samples show that the decay times at 10 K are slightly changed, exhibiting the longest time around at the PL peak, while at high T, the decay times increase rapidly with increasing wavelength, indicating carrier relaxation from smaller QSs to larger QSs via wetting layer/barrier. InP/InGaP QS sample grown at 460℃ shows the strongest PL intensity at 300 K and the longest decay time at 10 K, signifying the optimum growth T of 460℃.

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      참고문헌 (Reference)

      1 F. Hatami, 17 : 3703-, 2006

      2 S. Y. Kim, 12 : 5519-, 2012

      3 L.Y. Karachinsky, 84 : 7-, 2004

      4 H. Y. Kim, 132 : 1759-, 2012

      5 J. P. Reithmaier, 38 : 2088-, 2005

      6 A. Ugur, 323 : 228-, 2011

      7 R. Rödel, 23 : 015605-, 2012

      8 P. Podemski, 89 : 151902-, 2006

      9 N. K. Cho, 88 : 133104-, 2006

      10 B. Ilahi, 17 : 3707-, 2006

      1 F. Hatami, 17 : 3703-, 2006

      2 S. Y. Kim, 12 : 5519-, 2012

      3 L.Y. Karachinsky, 84 : 7-, 2004

      4 H. Y. Kim, 132 : 1759-, 2012

      5 J. P. Reithmaier, 38 : 2088-, 2005

      6 A. Ugur, 323 : 228-, 2011

      7 R. Rödel, 23 : 015605-, 2012

      8 P. Podemski, 89 : 151902-, 2006

      9 N. K. Cho, 88 : 133104-, 2006

      10 B. Ilahi, 17 : 3707-, 2006

      11 H. Yang, 296 : 8-, 2014

      12 Jae Won Oh, "Optical Properties of InP/InGaP Quantum Structures Grown by a Migration Enhanced Epitaxy with Different Growth Cycles" 한국진공학회 24 (24): 67-71, 2015

      13 S. K. Ha, "High-power 745-nm Laser Diode Utilizing InP/InGaP Quantum Structures Grown by Using Migration Enhanced Epitaxy" 한국물리학회 59 (59): 3089-3092, 2011

      14 변혜령, "Effect of an InGaP Spacer Layer on the Luminescence Properties of InP/InGaP Quantum Structures" 한국물리학회 66 (66): 811-815, 2015

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      학술지 이력

      학술지 이력
      연월일 이력구분 이력상세 등재구분
      2022 평가예정 계속평가 신청대상 (등재유지)
      2017-01-01 평가 우수등재학술지 선정 (계속평가)
      2014-06-16 학술지명변경 한글명 : Applied Science and Convergence Technology -> 한국진공학회지 KCI등재
      2014-02-06 학술지명변경 한글명 : ASCT -> Applied Science and Convergence Technology KCI등재
      2014-02-05 학술지명변경 한글명 : 한국진공학회지 -> ASCT
      외국어명 : Journal of the Koren Vacuum Society -> Applied Science and Convergence Technology
      KCI등재
      2014-01-01 학술지명변경 한글명 : 한국진공학회지 -> Applied Science and Convergence Technology KCI등재
      2013-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2010-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2008-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2005-05-23 학술지명변경 외국어명 : Journal of the Koren Cacuum Society -> Journal of the Koren Vacuum Society KCI등재
      2005-01-01 평가 등재학술지 선정 (등재후보2차) KCI등재
      2004-01-01 평가 등재후보 1차 PASS (등재후보1차) KCI등재후보
      2003-01-01 평가 등재후보학술지 선정 (신규평가) KCI등재후보
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      학술지 인용정보

      학술지 인용정보
      기준연도 WOS-KCI 통합IF(2년) KCIF(2년) KCIF(3년)
      2016 0.12 0.12 0.15
      KCIF(4년) KCIF(5년) 중심성지수(3년) 즉시성지수
      0.13 0.1 0.328 0.03
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