Multilayered PZT/BaTiO₃/PZT thick/thin/thick films were fabricated by two different methods-thick films of Pb₁.₁(Zr0.52Ti0.48)O₃ by a screen printing method on alumina substrate electrode with Pt, thin films of BaTiO₃by a spin-coating method...
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https://www.riss.kr/link?id=A104498221
Sung-Pill Nam (KawngWoon University) ; Sung-Gap Lee (Gyeongsang Natiional University) ; Young-Hie Lee (Kwangwoon University)
2008
English
KCI등재,SCIE,SCOPUS
학술저널
6-9(4쪽)
2
0
상세조회0
다운로드다국어 초록 (Multilingual Abstract)
Multilayered PZT/BaTiO₃/PZT thick/thin/thick films were fabricated by two different methods-thick films of Pb₁.₁(Zr0.52Ti0.48)O₃ by a screen printing method on alumina substrate electrode with Pt, thin films of BaTiO₃by a spin-coating method...
Multilayered PZT/BaTiO₃/PZT thick/thin/thick films were fabricated by two different methods-thick films of Pb₁.₁(Zr0.52Ti0.48)O₃
by a screen printing method on alumina substrate electrode with Pt, thin films of BaTiO₃by a spin-coating method with PZT
thick films and once more thick films of the PZT by a screen printing method on the BaTiO₃layer. We investigated the effect
of phase, composition, and interfacial state of the BaTiO₃ thin film layers at the interface between the PZT thick films. The
structural and the dielectric properties were investigated for the effect of various stacking sequences of sol-gel-prepared
BaTiO₃ layers at the interface of the PZT thick films. The insertion of the BaTiO₃ interlayer yielded PZT thick films with
homogeneous and dense grain structures regardless of the number of the BaTiO₃ layers. These results suggested that there is
coexistence of the PZT phase and the BaTiO₃ phase or the presence of a modified BaTiO₃ at the interfaces between the PZT
thick films. The leakage current density of a multilayered PZT-7 film is less that 1.5×10−9 A/cm2 at 5 V.
다국어 초록 (Multilingual Abstract)
Multilayered PZT/BaTiO₃/PZT thick/thin/thick films were fabricated by two different methods-thick films of Pb₁.₁(Zr0.52Ti0.48)O₃ by a screen printing method on alumina substrate electrode with Pt, thin films of BaTiO₃by a spin-coating metho...
Multilayered PZT/BaTiO₃/PZT thick/thin/thick films were fabricated by two different methods-thick films of Pb₁.₁(Zr0.52Ti0.48)O₃
by a screen printing method on alumina substrate electrode with Pt, thin films of BaTiO₃by a spin-coating method with PZT
thick films and once more thick films of the PZT by a screen printing method on the BaTiO₃layer. We investigated the effect
of phase, composition, and interfacial state of the BaTiO₃ thin film layers at the interface between the PZT thick films. The
structural and the dielectric properties were investigated for the effect of various stacking sequences of sol-gel-prepared
BaTiO₃ layers at the interface of the PZT thick films. The insertion of the BaTiO₃ interlayer yielded PZT thick films with
homogeneous and dense grain structures regardless of the number of the BaTiO₃ layers. These results suggested that there is
coexistence of the PZT phase and the BaTiO₃ phase or the presence of a modified BaTiO₃ at the interfaces between the PZT
thick films. The leakage current density of a multilayered PZT-7 film is less that 1.5×10−9 A/cm2 at 5 V.
참고문헌 (Reference)
1 J. Carrano, 38 (38): 255-258, 1991
2 Insung Kim, "Tunable Properties of Ferroelectric Thick films with MgO added on (BaSr)TiO₃" 대한전기학회 2 (2): 391-395, 2007
3 Abicht, H., "The influence of the milling liquid on the properties of barium titanate powders and ceramics" 51 (51): 478-492, 1997
4 G. S. Wang, "Properties of highly (100) oriented Ba0.9Sr0.1TiO3/LaNiO3 heterostructures prepared by chemical solution routes" 78 (78): 4172-4174, 2001
5 A. F. Tasch Jr., "Memory Cell, and Technology Issues for 64-and 256-Mbit One-Transistor Cell MOS DRAMs" 77 (77): 17-26, 1990
6 L. Baginsky, "Information Writing Mechanism in Thin Film MFIS-Structures, Ferroelectrics" 259-268, 1992
7 W. P. Noble, "Fundamental Limitations on DRAM Storage Capacitors" 45 : 156-161, 1984
8 Raza Moazzami, "Electrical characteristics of ferroelectric PZT thin films for DRAM applications" 39 : 2044-2049, 1992
9 M. Azuma, "Electrical characteristics of High Dielectric Constant Materials for Integrated Ferroelectrics" 109-102, 1992
10 S. G. Lee, "Dielectric properties of sol-gel derived PZT(40/60)/(60/40) heterolayered thin films" 353 : 244-247, 1999
1 J. Carrano, 38 (38): 255-258, 1991
2 Insung Kim, "Tunable Properties of Ferroelectric Thick films with MgO added on (BaSr)TiO₃" 대한전기학회 2 (2): 391-395, 2007
3 Abicht, H., "The influence of the milling liquid on the properties of barium titanate powders and ceramics" 51 (51): 478-492, 1997
4 G. S. Wang, "Properties of highly (100) oriented Ba0.9Sr0.1TiO3/LaNiO3 heterostructures prepared by chemical solution routes" 78 (78): 4172-4174, 2001
5 A. F. Tasch Jr., "Memory Cell, and Technology Issues for 64-and 256-Mbit One-Transistor Cell MOS DRAMs" 77 (77): 17-26, 1990
6 L. Baginsky, "Information Writing Mechanism in Thin Film MFIS-Structures, Ferroelectrics" 259-268, 1992
7 W. P. Noble, "Fundamental Limitations on DRAM Storage Capacitors" 45 : 156-161, 1984
8 Raza Moazzami, "Electrical characteristics of ferroelectric PZT thin films for DRAM applications" 39 : 2044-2049, 1992
9 M. Azuma, "Electrical characteristics of High Dielectric Constant Materials for Integrated Ferroelectrics" 109-102, 1992
10 S. G. Lee, "Dielectric properties of sol-gel derived PZT(40/60)/(60/40) heterolayered thin films" 353 : 244-247, 1999
11 Lefort-Courtois, V., "Control of the Composition of (Pb,Ti)O3 and Pb(Zr,Ti)O3 Thin films Obtained by RF Magnetron Sputtering Using a New Design of Target" 19 : 1373-1377, 1999
Characteristics of lithium titanate fabricated by an organic-inorganic solution route
Formation of titanium hydroxide nanoparticles in supercritical carbon dioxide
Electrochemical characteristics of Tin-based anode material for Li-ion secondary batteries
학술지 이력
연월일 | 이력구분 | 이력상세 | 등재구분 |
---|---|---|---|
2023 | 평가예정 | 해외DB학술지평가 신청대상 (해외등재 학술지 평가) | |
2022-10-24 | 학회명변경 | 한글명 : 세라믹연구소 -> 청정에너지연구소영문명 : Ceramic Research Institute -> Clean-Energy Research Institute | ![]() |
2020-01-01 | 평가 | 등재학술지 유지 (해외등재 학술지 평가) | ![]() |
2019-08-19 | 학회명변경 | 한글명 : 세라믹공정연구센터 -> 세라믹연구소영문명 : Ceramic Processing Research Center -> Ceramic Research Institute | ![]() |
2011-01-01 | 평가 | 등재학술지 유지 (등재유지) | ![]() |
2006-01-01 | 평가 | SCI 등재 (등재후보1차) | ![]() |
2003-01-01 | 평가 | 등재후보학술지 선정 (신규평가) | ![]() |
학술지 인용정보
기준연도 | WOS-KCI 통합IF(2년) | KCIF(2년) | KCIF(3년) |
---|---|---|---|
2016 | 0 | 0 | 0 |
KCIF(4년) | KCIF(5년) | 중심성지수(3년) | 즉시성지수 |
0 | 0 | 0 | 0 |