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      실리콘 웨이퍼 습식 식각장치 설계 및 공정개발 = Design of Single-wafer Wet Etching Bath for Silicon Wafer Etching

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      https://www.riss.kr/link?id=A106931749

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      다국어 초록 (Multilingual Abstract) kakao i 다국어 번역

      Silicon wafer etching in micro electro mechanical systems (MEMS) fabrication is challenging to form 3-D structures. Well known Si-wet etch of silicon employs potassium hydroxide (KOH), tetramethylammonium hydroxide (TMAH) and sodium hydroxide (NaOH). However, the existing silicon wet etching process has a fatal disadvantage that etching of the back side of the wafer is hard to avoid. In this study, a wet etching bath for 150 mm wafers was designed to prevent back-side etching of silicon wafer, and we demonstrated the optimized process recipe to have anisotropic wet etching of silicon wafer without any damage on the backside. We also presented the design of wet bath for 300 mm wafer processing as a promising process development.
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      Silicon wafer etching in micro electro mechanical systems (MEMS) fabrication is challenging to form 3-D structures. Well known Si-wet etch of silicon employs potassium hydroxide (KOH), tetramethylammonium hydroxide (TMAH) and sodium hydroxide (NaOH). ...

      Silicon wafer etching in micro electro mechanical systems (MEMS) fabrication is challenging to form 3-D structures. Well known Si-wet etch of silicon employs potassium hydroxide (KOH), tetramethylammonium hydroxide (TMAH) and sodium hydroxide (NaOH). However, the existing silicon wet etching process has a fatal disadvantage that etching of the back side of the wafer is hard to avoid. In this study, a wet etching bath for 150 mm wafers was designed to prevent back-side etching of silicon wafer, and we demonstrated the optimized process recipe to have anisotropic wet etching of silicon wafer without any damage on the backside. We also presented the design of wet bath for 300 mm wafer processing as a promising process development.

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      참고문헌 (Reference)

      1 노성래, "초임계 유체와 공용매를 이용한 미세전자기계시스템 웨이퍼의 식각, 세정을 위한 최적공정조건" 한국반도체디스플레이기술학회 16 (16): 41-46, 2017

      2 D. Lee, "Vertical Mirror Fabrication Combining KOH Etch and DRIE of(110)Silicon" 18 (18): 217-227, 2008

      3 M. Yun, "Investigation of KOH Anisotropic Etching for the Fabrication of Sharp Tips in Silicon-on-Insulator (SOI) Material" 37 (37): 605-610, 2000

      4 D. L. Kendall, "Handbook of Microlithography, Micromachining, and Microfabrication, Volume 2" 43-89, 1997

      5 S. Dutta, "Fabrication Challenges for Realization of Wet Etching Based Comb Type Capacitive Microaccelerometer Structure" 111 (111): 18-24, 2009

      6 Y. Ahn, "Etching Method of Thin Film on the Backside of Wafer Using Single Wafer Processing Tool" 5 (5): 47-49, 2006

      7 K. R. Wiliam, "Etch Rate for Micromachining Processing-Part Ⅱ" 12 (12): 761-778, 2003

      8 K. Biswas, "Etch Characteristics of KOH, TMAH and Dual Doper TMAH for Bulk Micromachining of Silicon" 37 : 519-525, 2006

      9 C. Yang, "Effects of Various Ion-typed Surfactants on Silicon Anisotropic Etching Properties in KOH and TMAH Solutions" 119 (119): 271-281, 2005

      10 R. Bhandari, "A Wafer-scale Etching Technique for High Aspect Ratio Implantable MEMS Structures" 162 (162): 130-136, 2010

      1 노성래, "초임계 유체와 공용매를 이용한 미세전자기계시스템 웨이퍼의 식각, 세정을 위한 최적공정조건" 한국반도체디스플레이기술학회 16 (16): 41-46, 2017

      2 D. Lee, "Vertical Mirror Fabrication Combining KOH Etch and DRIE of(110)Silicon" 18 (18): 217-227, 2008

      3 M. Yun, "Investigation of KOH Anisotropic Etching for the Fabrication of Sharp Tips in Silicon-on-Insulator (SOI) Material" 37 (37): 605-610, 2000

      4 D. L. Kendall, "Handbook of Microlithography, Micromachining, and Microfabrication, Volume 2" 43-89, 1997

      5 S. Dutta, "Fabrication Challenges for Realization of Wet Etching Based Comb Type Capacitive Microaccelerometer Structure" 111 (111): 18-24, 2009

      6 Y. Ahn, "Etching Method of Thin Film on the Backside of Wafer Using Single Wafer Processing Tool" 5 (5): 47-49, 2006

      7 K. R. Wiliam, "Etch Rate for Micromachining Processing-Part Ⅱ" 12 (12): 761-778, 2003

      8 K. Biswas, "Etch Characteristics of KOH, TMAH and Dual Doper TMAH for Bulk Micromachining of Silicon" 37 : 519-525, 2006

      9 C. Yang, "Effects of Various Ion-typed Surfactants on Silicon Anisotropic Etching Properties in KOH and TMAH Solutions" 119 (119): 271-281, 2005

      10 R. Bhandari, "A Wafer-scale Etching Technique for High Aspect Ratio Implantable MEMS Structures" 162 (162): 130-136, 2010

      11 H. Ni, "A Robust Two-step Etching Process for Large-scale Microfabricated SiO2 and Si3N4 MEMS Membranes" 119 (119): 553-558, 2005

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      학술지 이력

      학술지 이력
      연월일 이력구분 이력상세 등재구분
      2027 평가 재인증평가 신청대상 (재인증)
      2021-01-01 등재 등재학술지 유지 (재인증) KCI등재
      2019-01-01 등재 등재학술지 유지 (계속평가) KCI등재
      2016-01-01 등재 등재학술지 유지 (계속평가) KCI등재
      2012-01-01 등재 등재학술지 유지 (등재유지) KCI등재
      2010-03-25 학회명변경 한글명 : 한국반도체및디스플레이장비학회 -> 한국반도체디스플레이기술학회
      영문명 : The Korean Society of Semiconductor & Display Equipment Technology -> The Korean Society of Semiconductor & Display Technology
      KCI등재
      2010-03-25 학술지명변경 한글명 : 반도체및디스플레이장비학회지 -> 반도체디스플레이기술학회지
      외국어명 : Journal of the Semiconductor and Display Equipment Technology -> Journal of the Semiconductor & Display Technology
      KCI등재
      2009-01-01 등재 등재학술지 선정 (등재후보2차) KCI등재
      2008-01-01 등재 등재후보 1차 PASS (등재후보1차) KCI등재후보
      2006-01-01 등재 등재후보학술지 선정 (신규평가) KCI등재후보
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      기준연도 WOS-KCI 통합IF(2년) KCIF(2년) KCIF(3년)
      2016 0.29 0.29 0.26
      KCIF(4년) KCIF(5년) 중심성지수(3년) 즉시성지수
      0.21 0.18 0.217 0.02
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