1 N. Pan, 876-, 2006
2 J. M. Hu, 181-, 1992
3 D. Ryu, 45 : 611-, 2005
4 J. Bartelo, 1-, 2001
5 O. Salmela, 30 (30): 700-, 2007
6 W. S. Hong, 25 (25): 184-, 2007
7 J. F. Lawless, "Statistical Models and Methods for Lifetime Data" John Wiley & Sons 227-, 1982
8 T. Minomiya, "Sony Semiconductor/Quality and Reliability Handbook, 1st ed" Sony Co 136-150, 2000
9 홍원식, "Sn-3.0 Ag-0.5 Cu/OSP 무연솔더 접합계면의 접합강도 변화에 따른 전자부품 열충격 싸이클 최적화" 한국재료학회 17 (17): 152-159, 2007
10 K. Ohno, "Matzusida Electron" 2003
1 N. Pan, 876-, 2006
2 J. M. Hu, 181-, 1992
3 D. Ryu, 45 : 611-, 2005
4 J. Bartelo, 1-, 2001
5 O. Salmela, 30 (30): 700-, 2007
6 W. S. Hong, 25 (25): 184-, 2007
7 J. F. Lawless, "Statistical Models and Methods for Lifetime Data" John Wiley & Sons 227-, 1982
8 T. Minomiya, "Sony Semiconductor/Quality and Reliability Handbook, 1st ed" Sony Co 136-150, 2000
9 홍원식, "Sn-3.0 Ag-0.5 Cu/OSP 무연솔더 접합계면의 접합강도 변화에 따른 전자부품 열충격 싸이클 최적화" 한국재료학회 17 (17): 152-159, 2007
10 K. Ohno, "Matzusida Electron" 2003
11 JESD 94A, "Application Specific Qualification Using Knowledge Based Test Methodology" JEDEC Standard 2007