In this paper, we reported a final polishing machine for 300 ㎜ bare wafer. The final polishing system of bare 300 ㎜ wafer is developed for replacing multistage polishing and grinding process with high quality of flatness required in 0.13 ㎛ desig...
http://chineseinput.net/에서 pinyin(병음)방식으로 중국어를 변환할 수 있습니다.
변환된 중국어를 복사하여 사용하시면 됩니다.
https://www.riss.kr/link?id=A109097418
2008
Korean
003
학술저널
24-29(6쪽)
0
상세조회0
다운로드다국어 초록 (Multilingual Abstract)
In this paper, we reported a final polishing machine for 300 ㎜ bare wafer. The final polishing system of bare 300 ㎜ wafer is developed for replacing multistage polishing and grinding process with high quality of flatness required in 0.13 ㎛ desig...
In this paper, we reported a final polishing machine for 300 ㎜ bare wafer. The final polishing system of bare 300 ㎜ wafer is developed for replacing multistage polishing and grinding process with high quality of flatness required in 0.13 ㎛ design rule. The machine had three polishing tables and eight rotating heads that carries wafers attached on a indexing column so that three steps of the process were possible. The machine structure and components were designed and developed with support of numerical analysis for static and dynamic characteristics. The prototype built with utilities were tested, and the results of surface quality and flatness were discussed.
목차 (Table of Contents)
손상된 주축 내경 연마를 위한 연삭기 개발에 관한 연구