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      Interlaboratory Comparison of Critical Current Measurements on Ag-sheathed Bi-2223 tapes

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      https://www.riss.kr/link?id=A100687982

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      다국어 초록 (Multilingual Abstract)

      We have conducted two runs of interlaboratory comparison on Ag-sheathed Bi-2223 tapes to evaluate the level of measurement techniques for the critical current measurement. Two classes of specimens were prepared for parallel and serial routings and sent to four participating laboratories. The critical currents of specimens were measured at 77 K in zero magnetic field. In the first comparison, we used twenty different Bi-2223 tapes as specimens for comparison and participating laboratories measured the specimens using their own instruments and procedures. As a result, the scattering of data on the first comparison showed -3.0% to +l2.2% for the parallel routing and -0.7% to +l5.1% for the serial routing. Major sources of these variations were attributed to different measurement techniques. Thus, the second comparison of measurement was done on the same specimens under specified measurement conditions, particularly in terms of cooling procedure and sweep rate of the test current. The variations for the second comparison were decreased -3.1% to +3.2% far the parallel routing and -1.8% to +7.7% fur the serial routing.
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      We have conducted two runs of interlaboratory comparison on Ag-sheathed Bi-2223 tapes to evaluate the level of measurement techniques for the critical current measurement. Two classes of specimens were prepared for parallel and serial routings and sen...

      We have conducted two runs of interlaboratory comparison on Ag-sheathed Bi-2223 tapes to evaluate the level of measurement techniques for the critical current measurement. Two classes of specimens were prepared for parallel and serial routings and sent to four participating laboratories. The critical currents of specimens were measured at 77 K in zero magnetic field. In the first comparison, we used twenty different Bi-2223 tapes as specimens for comparison and participating laboratories measured the specimens using their own instruments and procedures. As a result, the scattering of data on the first comparison showed -3.0% to +l2.2% for the parallel routing and -0.7% to +l5.1% for the serial routing. Major sources of these variations were attributed to different measurement techniques. Thus, the second comparison of measurement was done on the same specimens under specified measurement conditions, particularly in terms of cooling procedure and sweep rate of the test current. The variations for the second comparison were decreased -3.1% to +3.2% far the parallel routing and -1.8% to +7.7% fur the serial routing.

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