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      SCOPUS KCI등재

      크기 조절이 가능한 은 나노입자 형성을 위한 박막의 열처리 효과 = Formation of Size-controllable Ag Nanoparticles on Si Substrate by Annealing

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      https://www.riss.kr/link?id=A105149802

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      다국어 초록 (Multilingual Abstract)

      In order to produce size-controllable Ag nanoparticles and a nanomesh-patterned Si substrate, we introduce a rapid thermal annealing(RTA) method and a metal assisted chemical etching(MCE) process. Ag nanoparticles were self-organized from a thin Ag film on a Si substrate through the RTA process. The mean diameter of the nanoparticles was modulated by changing the thickness of the Ag film. Furthermore, we controlled the surface energy of the Si substrate by changing the Ar or $H_2$ ambient gas during the RTA process, and the modified surface energy was evaluated through water contact angle test. A smaller mean diameter of Ag nanoparticles was obtained under $H_2$ gas at RTA, compared to that under Ar, from the same thickness of Ag thin film. This result was observed by SEM and summarized by statistical analysis. The mechanism of this result was determined by the surface energy change caused by the chemical reaction between the Si substrate and $H_2$. The change of the surface energy affected on uniformity in the MCE process using Ag nanoparticles as catalyst. The nanoparticles formed under ambient Ar, having high surface energy, randomly moved in the lateral direction on the substrate even though the etching solution consisting of 10 % HF and 0.12 % $H_2O_2$ was cooled down to $-20^{\circ}C$ to minimize thermal energy, which could act as the driving force of movement. On the other hand, the nanoparticles thermally treated under ambient $H_2$ had low surface energy as the surface of the Si substrate reacted with $H_2$. That's why the Ag nanoparticles could keep their pattern and vertically etch the Si substrate during MCE.
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      In order to produce size-controllable Ag nanoparticles and a nanomesh-patterned Si substrate, we introduce a rapid thermal annealing(RTA) method and a metal assisted chemical etching(MCE) process. Ag nanoparticles were self-organized from a thin Ag fi...

      In order to produce size-controllable Ag nanoparticles and a nanomesh-patterned Si substrate, we introduce a rapid thermal annealing(RTA) method and a metal assisted chemical etching(MCE) process. Ag nanoparticles were self-organized from a thin Ag film on a Si substrate through the RTA process. The mean diameter of the nanoparticles was modulated by changing the thickness of the Ag film. Furthermore, we controlled the surface energy of the Si substrate by changing the Ar or $H_2$ ambient gas during the RTA process, and the modified surface energy was evaluated through water contact angle test. A smaller mean diameter of Ag nanoparticles was obtained under $H_2$ gas at RTA, compared to that under Ar, from the same thickness of Ag thin film. This result was observed by SEM and summarized by statistical analysis. The mechanism of this result was determined by the surface energy change caused by the chemical reaction between the Si substrate and $H_2$. The change of the surface energy affected on uniformity in the MCE process using Ag nanoparticles as catalyst. The nanoparticles formed under ambient Ar, having high surface energy, randomly moved in the lateral direction on the substrate even though the etching solution consisting of 10 % HF and 0.12 % $H_2O_2$ was cooled down to $-20^{\circ}C$ to minimize thermal energy, which could act as the driving force of movement. On the other hand, the nanoparticles thermally treated under ambient $H_2$ had low surface energy as the surface of the Si substrate reacted with $H_2$. That's why the Ag nanoparticles could keep their pattern and vertically etch the Si substrate during MCE.

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      참고문헌 (Reference)

      1 A. Henglein, 84 : 3461-, 1980

      2 A. Majetich, 48 : 16845-, 1993

      3 J. J. Storhoff, 120 : 1959-, 1998

      4 S. M. Heard, 93 : 545-, 1983

      5 Y. Yonezawa, 183 : 1559-, 1987

      6 W. B. Choi, 1 : 6-, 2000

      7 M.O. Delcourt, 7 : 131-, 1983

      8 C. H. Walker, 123 : 3846-, 2001

      9 C. Petit, 97 : 12974-, 1993

      10 A. Taleb, 9 : 950-, 1997

      1 A. Henglein, 84 : 3461-, 1980

      2 A. Majetich, 48 : 16845-, 1993

      3 J. J. Storhoff, 120 : 1959-, 1998

      4 S. M. Heard, 93 : 545-, 1983

      5 Y. Yonezawa, 183 : 1559-, 1987

      6 W. B. Choi, 1 : 6-, 2000

      7 M.O. Delcourt, 7 : 131-, 1983

      8 C. H. Walker, 123 : 3846-, 2001

      9 C. Petit, 97 : 12974-, 1993

      10 A. Taleb, 9 : 950-, 1997

      11 R. A. Salkar, 9 : 1333-, 1999

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      유사연구자 (20) 활용도상위20명

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      학술지 이력

      학술지 이력
      연월일 이력구분 이력상세 등재구분
      2023 평가예정 해외DB학술지평가 신청대상 (해외등재 학술지 평가)
      2020-01-01 평가 등재학술지 유지 (해외등재 학술지 평가) KCI등재
      2014-03-01 평가 SCOPUS 등재 (기타) KCI등재
      2011-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2009-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2007-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2005-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2002-01-01 평가 등재학술지 선정 (등재후보2차) KCI등재
      1999-07-01 평가 등재후보학술지 선정 (신규평가) KCI등재후보
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      학술지 인용정보

      학술지 인용정보
      기준연도 WOS-KCI 통합IF(2년) KCIF(2년) KCIF(3년)
      2016 0.15 0.15 0.14
      KCIF(4년) KCIF(5년) 중심성지수(3년) 즉시성지수
      0.14 0.13 0.255 0.03
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