비정질 셀레늄층과 비정질 실리콘TFT배열을 사용하는 디지털 X-선 검출기의 영상특성 평가 = Image Quality Evaluation of Digital X-Ray Detector Using Amorphous Selenium Layer and Amorphous Silicon TFT Array

다국어 초록 (Multilingual Abstract)

In this study, we have conducted characterization of imaging performance for a flat panel digital X-ray detector using amorphous Selenium and a-Si TFT which was developed by the authors. The procedures for characterization were in concordance with internationally recommended standards such as IEC (international electrotechnical commission). The measures used for imaging performance characterization include response characteristic, modulation transfer function (MTF), detective quantum efficiency (DQE), noise power spectrum (NPS), and quantum limited performance. The measured DQEs at lowest and highest spatial frequencies were 40% and 25% respectively, which was superior to that of commercial products by overseas vendor. The MTF values were significantly superior to that of CR and indirect type DRs. The quantum limited performance showed the detector was limited by quantum noise at the entrance exposure level below 0.023 mR, which is sufficiently low for general X-ray examination.

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