1 H. Li, 31 : 124003-, 2010
2 Y. S. Wang, 23 : 152-, 2008
3 B. J. Baliga, 31 : 683-, 1984
4 Bongseong Kim, "Study of Switching Characteristics of Static Induction Thyristor for Pulsed Power Applications" Institute of Electrical and Electronics Engineers (IEEE) 39 (39): 901-905, 2011
5 T. Trajkovic, "Silicon MOS controlled bipolar power switching devices using trench technology" Informa UK Limited 86 (86): 1153-1168, 1999
6 Hairong Li, "Physical Features of the Barrier-Controlled Blocking Function of the Static Induction Thyristor" Institute of Electrical and Electronics Engineers (IEEE) 58 (58): 1149-1157, 2011
7 Wenchao Chen, "Intrinsic delay of permeable base transistor" AIP Publishing 116 (116): 044505-, 2014
8 B.J. Baliga, "High-voltage junction-gate field-effect transistor with recessed gates" Institute of Electrical and Electronics Engineers (IEEE) 29 (29): 1560-1570, 1982
9 Hidekatsu Onose, "Characterization of high-dose and high-energy implanted gate and source diode and analysis of lateral spreading of p gate profile in high voltage SiC static induction transistors" Elsevier BV 129 : 200-205, 2017
1 H. Li, 31 : 124003-, 2010
2 Y. S. Wang, 23 : 152-, 2008
3 B. J. Baliga, 31 : 683-, 1984
4 Bongseong Kim, "Study of Switching Characteristics of Static Induction Thyristor for Pulsed Power Applications" Institute of Electrical and Electronics Engineers (IEEE) 39 (39): 901-905, 2011
5 T. Trajkovic, "Silicon MOS controlled bipolar power switching devices using trench technology" Informa UK Limited 86 (86): 1153-1168, 1999
6 Hairong Li, "Physical Features of the Barrier-Controlled Blocking Function of the Static Induction Thyristor" Institute of Electrical and Electronics Engineers (IEEE) 58 (58): 1149-1157, 2011
7 Wenchao Chen, "Intrinsic delay of permeable base transistor" AIP Publishing 116 (116): 044505-, 2014
8 B.J. Baliga, "High-voltage junction-gate field-effect transistor with recessed gates" Institute of Electrical and Electronics Engineers (IEEE) 29 (29): 1560-1570, 1982
9 Hidekatsu Onose, "Characterization of high-dose and high-energy implanted gate and source diode and analysis of lateral spreading of p gate profile in high voltage SiC static induction transistors" Elsevier BV 129 : 200-205, 2017