LACBED 패턴으로부터 전자현미경 상에 대한 회절도형의 회전각을 측정하는 간단한 방법 = A Simple Method to Determination the Rotation Angle Between an Image and its Diffraction Pattern with LACBED Patterns

다국어 초록 (Multilingual Abstract)

When electron microscope images and selected area diffraction patterns of crystalline materials are being compared, it is important to know for the rotation of the diffraction pattern with respect to the image caused by the magnetic lens in the Electron Microscope. A well-known method to determine this rotation is to use a test crystal of $MoO_3$. But this method of determination of the rotation angle contains an uncertainty of $180^{\circ}$. Thus one has to devise another way to eliminate this uncertainty. In this paper we present a new and simple method of determining this rotation without any complexity. The method involves a process of obtaining LACBED patterns of crystalline materials. For the J2010 electron microscope, the rotation is determined to be $180^{\circ}$ and this angle remains unchanged for changing of the magnification and the camera length.