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      초고주파 전력 트랜지스터의 Sweet spot에서의 위상 변화 특성 연구 = A Study on the Relative Phase Variation at the Sweet spot of Microwave Power Transistor

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      https://www.riss.kr/link?id=A105642435

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      When the high power transistor is used for amplifier in microwave frequency, the bias of transistor is usually AB-class or B-c1ass because of power efficiency. The sweet spot point having small IMD signal compared with near neighborhood exicts frequently in the high power transistor using AB class bias or B-class bias. On the sweet spot, the magnitude and phase of the main and IMD signal of HPA output change as the input signal power change, respective the relative phase on the sweet spot changes rapidly. If we know exactly the magnitude and phase characteristics of IMD signal, we can design a more adequate linearizer and understand the characteristics of transistor. In this paper the magnitude and phase of the main and IMD signal of HPA output on the sweet spot are measured using the designed hardware.
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      When the high power transistor is used for amplifier in microwave frequency, the bias of transistor is usually AB-class or B-c1ass because of power efficiency. The sweet spot point having small IMD signal compared with near neighborhood exicts frequen...

      When the high power transistor is used for amplifier in microwave frequency, the bias of transistor is usually AB-class or B-c1ass because of power efficiency. The sweet spot point having small IMD signal compared with near neighborhood exicts frequently in the high power transistor using AB class bias or B-class bias. On the sweet spot, the magnitude and phase of the main and IMD signal of HPA output change as the input signal power change, respective the relative phase on the sweet spot changes rapidly. If we know exactly the magnitude and phase characteristics of IMD signal, we can design a more adequate linearizer and understand the characteristics of transistor. In this paper the magnitude and phase of the main and IMD signal of HPA output on the sweet spot are measured using the designed hardware.

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