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      재구성이 가능한 임베디드 시스템 테스트 실행기 = Softwanre Engineering : Reconfigurable Test Execution Machine for Embedded System

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      https://www.riss.kr/link?id=A100083746

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      다국어 초록 (Multilingual Abstract)

      When building a testing environment with a testing platform, the configuration of test executor and its interface should be built to be appropriate for the system under test (SUT). That is, it is necessary to build the test executor and interface environment that can properly handle the input and output signals of SUT. If the testing platform is not extendable, it should be modified significantly whenever new SUTs and models are tested. It is a serious drawback that the test executor and interface configuration need to be modified depending on testing targets. To overcome the drawback, this paper proposes TEM(test Execution Machine), which allows for test executor to reconfigure its environment suitable to new SUTs by modifying the configuration file. The proposed TEM is verified through testing two real systems.
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      When building a testing environment with a testing platform, the configuration of test executor and its interface should be built to be appropriate for the system under test (SUT). That is, it is necessary to build the test executor and interface envi...

      When building a testing environment with a testing platform, the configuration of test executor and its interface should be built to be appropriate for the system under test (SUT). That is, it is necessary to build the test executor and interface environment that can properly handle the input and output signals of SUT. If the testing platform is not extendable, it should be modified significantly whenever new SUTs and models are tested. It is a serious drawback that the test executor and interface configuration need to be modified depending on testing targets. To overcome the drawback, this paper proposes TEM(test Execution Machine), which allows for test executor to reconfigure its environment suitable to new SUTs by modifying the configuration file. The proposed TEM is verified through testing two real systems.

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      참고문헌 (Reference)

      1 Whittaker, James A., "What is software testing? And why is it so hard?" 17 (17): 70-79, 2000

      2 Daeyoung Lee, "Software test, the “march” toward at higher"

      3 AHN, Kyoung Kwan, "Self-tuning of quantitative feedback theory for force control of an electro-hydraulic test machine," 17 : 1291-1306, 2009

      4 Compton, Katherine, "Reconfigurable computing: a survey of systems and software" 34 (34): 171-210, 2002

      5 Aksit, Mehmet, "Obstacles in object-oriented software development" 27 (27): 341-358, 1992

      6 Sermann, R., "Hardware-in- the-loop simulation for the design and testing of engine- control systems" 7 (7): 643-653, 1999

      7 Youngsuk Jang, "Empirical Study for Manual vs. Automated Test of Embedded Software" 30 (30): 343-345, 2003

      8 Ebert, Christof, "Embedded software:Facts, figures, and future" 42 (42): 42-52, 2009

      9 Sanggyun Hong, "Embedded SW test, the start of safety and reliability"

      10 Kiyun Jeong, "BLDC MCU Failure Mode Evaluation by HILS" 1438-1443, 2011

      1 Whittaker, James A., "What is software testing? And why is it so hard?" 17 (17): 70-79, 2000

      2 Daeyoung Lee, "Software test, the “march” toward at higher"

      3 AHN, Kyoung Kwan, "Self-tuning of quantitative feedback theory for force control of an electro-hydraulic test machine," 17 : 1291-1306, 2009

      4 Compton, Katherine, "Reconfigurable computing: a survey of systems and software" 34 (34): 171-210, 2002

      5 Aksit, Mehmet, "Obstacles in object-oriented software development" 27 (27): 341-358, 1992

      6 Sermann, R., "Hardware-in- the-loop simulation for the design and testing of engine- control systems" 7 (7): 643-653, 1999

      7 Youngsuk Jang, "Empirical Study for Manual vs. Automated Test of Embedded Software" 30 (30): 343-345, 2003

      8 Ebert, Christof, "Embedded software:Facts, figures, and future" 42 (42): 42-52, 2009

      9 Sanggyun Hong, "Embedded SW test, the start of safety and reliability"

      10 Kiyun Jeong, "BLDC MCU Failure Mode Evaluation by HILS" 1438-1443, 2011

      11 J. Y. Seo, "Automating Embedded software testing on an Emulated Target Board" 9-9, 2007

      12 Edwards, Stephen H., "A framework for practical, automated black? box testing of component?based software" 11 (11): 97-111, 2001

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      학술지 이력

      학술지 이력
      연월일 이력구분 이력상세 등재구분
      2027 평가예정 재인증평가 신청대상 (재인증)
      2021-01-01 평가 등재학술지 유지 (재인증) KCI등재
      2018-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2015-01-01 평가 등재학술지 유지 (계속평가) KCI등재
      2012-10-31 학술지명변경 한글명 : 소프트웨어 및 데이터 공학 -> 정보처리학회논문지. 소프트웨어 및 데이터 공학 KCI등재
      2012-10-10 학술지명변경 한글명 : 정보처리학회논문지B -> 소프트웨어 및 데이터 공학
      외국어명 : The KIPS Transactions : Part B -> KIPS Transactions on Software and Data Engineering
      KCI등재
      2010-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2008-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2006-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2003-01-01 평가 등재학술지 선정 (등재후보2차) KCI등재
      2002-01-01 평가 등재후보 1차 PASS (등재후보1차) KCI등재후보
      2000-07-01 평가 등재후보학술지 선정 (신규평가) KCI등재후보
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      학술지 인용정보

      학술지 인용정보
      기준연도 WOS-KCI 통합IF(2년) KCIF(2년) KCIF(3년)
      2016 0.35 0.35 0.28
      KCIF(4년) KCIF(5년) 중심성지수(3년) 즉시성지수
      0.23 0.19 0.511 0.06
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