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Approximation of Critical Area of ICs with Simple Parameters Extracted from the Layout
Duvivier, F.;Rivier, M. IEEE Computer Society Press 1995 p.1-9
AFFCCA: A Tool for Critical Area Analysis with Circular Defects and Lithography Deformed Layout
Maly, W.;Bubel, I.;Waas, T.;Nag, P. K. IEEE Computer Society Press 1995 p.10-18
Hierarchical Extraction of Critical Area for Shorts in Very Large Ics
Nag, P. K.;Maly, W. IEEE Computer Society Press 1995 p.19-27
Hierarchical Critical Area Extraction with the EYE tool
Allan, G. A.;Walton, A. J. IEEE Computer Society Press 1995 p.28-36
Wafer-Scale Integration Defect Avoidance Tradeoffs between Laser Links and Omega Network Switching
Chapman, G. H.;Bergen, D. E.;Fang, K. IEEE Computer Society Press 1995 p.37-45
The Effect of Spot Defects on the Parametric Yield of Long Interconnection Lines
Wagner, I. A.;Koren, I. IEEE Computer Society Press 1995 p.46-54
Critical Area Extraction of Extra Material Soft Faults
Allan, G. A.;Walton, A. J. IEEE Computer Society Press 1995 p.55-62
Switch Level Hot-Carrier Reliability Enhancement of VLSI Circuits
Karri, R.;Dasgupta, A. IEEE Computer Society Press 1995 p.63-71
A Model for the Evaluation of Fault Tolerance in the FERMI System
Breveglieri, L.;Antola, A. IEEE Computer Society Press 1995 p.72-80
Efficient Algorithms for Analyzing and Synthesizing Fault-Tolerant Datapaths
Ravi, S. S.;Narasimhan, R.;Rosenkrantz, D. J. IEEE Computer Society Press 1995 p.81-89