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      KCI등재 SCIE SCOPUS

      Sol-Gel Processed GZO Thin Film from Low Concentration Solution and Investigating GZO/Cs2CO3 Bilayer

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      https://www.riss.kr/link?id=A105873707

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      다국어 초록 (Multilingual Abstract)

      Highly transparent Gallium doped ZnO (GZO) thin films with different ratios of Gallium were synthesized by sol-gel process and dip coating technique. Concentration of the used solutions for dip coating was 0.09 M.
      Morphological investigations were done on GZO thin films with 0, 0.5, 1 and 2 at. % gallium content. Influences of doping ratio and post-annealing temperature on optical and electrical properties of the films were also studied. It was found that the film prepared from the solution containing 2 at. % Ga had improved structural properties, less electrical resistivity and biggest optical transmittance. The thickness dependence of the band gap of 2 at.% GZO thin films was also examined. Effect of Cs2CO3 nanolayer and ZnO thin film deposited on 2 at.% GZO thin film was studied. SEM images exhibited island features on the surface of GZO/Cs2CO3 bilayer.
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      Highly transparent Gallium doped ZnO (GZO) thin films with different ratios of Gallium were synthesized by sol-gel process and dip coating technique. Concentration of the used solutions for dip coating was 0.09 M. Morphological investigations were don...

      Highly transparent Gallium doped ZnO (GZO) thin films with different ratios of Gallium were synthesized by sol-gel process and dip coating technique. Concentration of the used solutions for dip coating was 0.09 M.
      Morphological investigations were done on GZO thin films with 0, 0.5, 1 and 2 at. % gallium content. Influences of doping ratio and post-annealing temperature on optical and electrical properties of the films were also studied. It was found that the film prepared from the solution containing 2 at. % Ga had improved structural properties, less electrical resistivity and biggest optical transmittance. The thickness dependence of the band gap of 2 at.% GZO thin films was also examined. Effect of Cs2CO3 nanolayer and ZnO thin film deposited on 2 at.% GZO thin film was studied. SEM images exhibited island features on the surface of GZO/Cs2CO3 bilayer.

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      참고문헌 (Reference)

      1 Q. -B. Ma, 58 : 21-, 2008

      2 W. Tang, 238 : 83-, 1994

      3 V. Assuncão, 442 : 102-, 2003

      4 S. Fay, 86 : 385-, 2005

      5 B. -Z. Dong, 101 : 033713-, 2007

      6 S. Golshahi, 518 : 1149-, 2009

      7 A. K. K. Kyaw, 93 : 221107-, 2008

      8 H. M. Zhou, 515 : 6909-, 2007

      9 H. -H. Liao, 92 : 173303-, 2008

      10 D. -Y. Chung, 98 : 103306-, 2011

      1 Q. -B. Ma, 58 : 21-, 2008

      2 W. Tang, 238 : 83-, 1994

      3 V. Assuncão, 442 : 102-, 2003

      4 S. Fay, 86 : 385-, 2005

      5 B. -Z. Dong, 101 : 033713-, 2007

      6 S. Golshahi, 518 : 1149-, 2009

      7 A. K. K. Kyaw, 93 : 221107-, 2008

      8 H. M. Zhou, 515 : 6909-, 2007

      9 H. -H. Liao, 92 : 173303-, 2008

      10 D. -Y. Chung, 98 : 103306-, 2011

      11 G. Jo, 97 : 213301-, 2010

      12 S. B. Majumder, 103 : 16-, 2003

      13 J. -H. Lee, 426 : 94-, 2003

      14 J. H. Lee, 247 : 119-, 2003

      15 R. Al Asmar, 83 : 393-, 2006

      16 A. Liu, 198 : 494-, 2011

      17 W. J. Park, 93 : 083508-, 2008

      18 Y. W. Heo, 78 : 53-, 2004

      19 M. Dutta, 254 : 2743-, 2008

      20 L. Gao, 257 : 2498-, 2011

      21 J. Yu, 379 : 7-, 2000

      22 T. PrasadaRao, 506 : 788-, 2010

      23 D. Zhu, 255 : 6145-, 2009

      24 X. Xu, 32 : 685-, 2012

      25 Y. Park, 538 : 20-, 2011

      26 G. Cheng, 103 : 164-, 2012

      27 R. G. Gordon, 25 : 52-, 2000

      28 V. Bhosle, 100 : 093519-, 2006

      29 T. Minami, 516 : 1314-, 2008

      30 T. Hamaguchi, 65 : 51-, 2008

      31 K. Ellmer, 34 : 3097-, 2001

      32 J. Zhao, 253 : 841-, 2006

      33 Yasemin Caglar, "Microstructural, optical and electrical studies on sol gel derived ZnO and ZnO:Al films" 한국물리학회 12 (12): 963-968, 2012

      34 Chien-Yie Tsay, "Effect of dopants on the structural, optical and electrical properties of solegel derived ZnO semiconductor thin films" 한국물리학회 13 (13): 60-65, 2013

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      학술지 이력

      학술지 이력
      연월일 이력구분 이력상세 등재구분
      학술지등록 한글명 : Electronic Materials Letters
      외국어명 : Electronic Materials Letters
      2023 평가예정 해외DB학술지평가 신청대상 (해외등재 학술지 평가)
      2020-01-01 평가 등재학술지 유지 (해외등재 학술지 평가) KCI등재
      2013-10-01 평가 등재학술지 선정 (기타) KCI등재
      2011-01-01 평가 등재후보학술지 유지 (기타) KCI등재후보
      2009-12-29 학회명변경 한글명 : 대한금속ㆍ재료학회 -> 대한금속·재료학회 KCI등재후보
      2008-01-01 평가 SCIE 등재 (신규평가) KCI등재후보
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      학술지 인용정보

      학술지 인용정보
      기준연도 WOS-KCI 통합IF(2년) KCIF(2년) KCIF(3년)
      2016 1.68 0.41 1.08
      KCIF(4년) KCIF(5년) 중심성지수(3년) 즉시성지수
      0.89 0.83 0.333 0.06
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