X-ray microdiffraction measurements with the CCD using a tapered optical fiber coupling

다국어 초록 (Multilingual Abstract)

White-beam X-ray microdiraction measurements use analyzed results of Laue images recorded
by X-ray sensitive charge coupled detectors(CCD). If the accuracy of the measured lattice parameters
is to be improved, the number of diracted peaks needs to be increased by using a large CCD,
but large area CCD chips are rare and expensive. An alternative is a CCD with tapered beroptic
coupling. However, it introduces unwanted distortion of the Laue image, which degrades the quality
of the measurements. In this study, a rountine was developed to correct the image distortion, and
the errors in the strain measurements were estimated with and without the correction. As long as
the distortion is smooth and less than 1 % of the CCD size, the distortion can be corrected by the
routine up to an accuracy of 10က5 in determining lattice parameters.

참고문헌 (Reference)

1 "Nature Materials" 2 (2): 2003

2 "European Synchrotron Radia-tion Facility Report of European Synchrotron RadiationProject" Cern LEP Division, Geneva, Switzerland, 1984.

3 "Character-istics of the 7 GeV Advanced Photon Source: A Guidefor Users" Argonne National Laboratory, Argonne, IL (ANL-88-9.) : 1988