1 서훈철, "웨이블릿 변환을 이용한 고장과 Variation의 유형 구분 알고리즘 개발" 대한전기학회 60 (60): 1460-1466, 2011
2 손영락, "웨이브렛 변환을 이용한 배전계통의 전력품질 외란 검출에 관한 연구" 대한전기학회 54 (54): 328-336, 2005
3 Math H. J. Bollen, "Understanding Power Quality Problems: Voltage Sags and Interruptions" John Wiley & Sons 1999
4 Turner, R. A, "Transformer Inrush Current" 16 (16): 14-19, 2010
5 IEEE Distribution Planning Working Group Report, "Radial distribution test feeders" 6 (6): 975-985, 1991
6 "Protective Relaying and Power Quality" IEEE PSRC
7 Gaouda A. M., "Power Quality Detection and Classification using wavelet-multiresolution signal decomposition" 14 (14): 1469-1476, 1999
8 P. K. Dash, "Power Quality Analysis Using S-transform" 18 (18): 2003
9 R. G. Stockwell, "Localization of the Complex Spectrum: The Stransform" 44 (44): 1996
10 Gomez Juan, "Effect of the overcurrent protection settings ondistributions systems on the resultant power quality" 1-4, 2005
1 서훈철, "웨이블릿 변환을 이용한 고장과 Variation의 유형 구분 알고리즘 개발" 대한전기학회 60 (60): 1460-1466, 2011
2 손영락, "웨이브렛 변환을 이용한 배전계통의 전력품질 외란 검출에 관한 연구" 대한전기학회 54 (54): 328-336, 2005
3 Math H. J. Bollen, "Understanding Power Quality Problems: Voltage Sags and Interruptions" John Wiley & Sons 1999
4 Turner, R. A, "Transformer Inrush Current" 16 (16): 14-19, 2010
5 IEEE Distribution Planning Working Group Report, "Radial distribution test feeders" 6 (6): 975-985, 1991
6 "Protective Relaying and Power Quality" IEEE PSRC
7 Gaouda A. M., "Power Quality Detection and Classification using wavelet-multiresolution signal decomposition" 14 (14): 1469-1476, 1999
8 P. K. Dash, "Power Quality Analysis Using S-transform" 18 (18): 2003
9 R. G. Stockwell, "Localization of the Complex Spectrum: The Stransform" 44 (44): 1996
10 Gomez Juan, "Effect of the overcurrent protection settings ondistributions systems on the resultant power quality" 1-4, 2005
11 Gomez Juan, "Effect of the overcurrent protection settings ondistributions systems on the resultant power quality" 1-4, 2005
12 서훈철, "Analysis of the Neutral Current for Two-Step-Type Poles in Distribution Lines" IEEE 24 : 1483-1489, 200907