Hydrogenated amorphous carbon (a-C:H) films were deposited on soda-lime glass substrates by using a DC facing target sputtering system. The effects of the CH<sub>4</sub> gas and the substrate temperature on the deposition rate and the prop...

http://chineseinput.net/에서 pinyin(병음)방식으로 중국어를 변환할 수 있습니다.
변환된 중국어를 복사하여 사용하시면 됩니다.
https://www.riss.kr/link?id=A104212720
2013
English
KCI등재,SCI,SCIE,SCOPUS
학술저널
258-262(5쪽)
5
0
상세조회0
다운로드다국어 초록 (Multilingual Abstract)
Hydrogenated amorphous carbon (a-C:H) films were deposited on soda-lime glass substrates by using a DC facing target sputtering system. The effects of the CH<sub>4</sub> gas and the substrate temperature on the deposition rate and the prop...
Hydrogenated amorphous carbon (a-C:H) films were deposited on soda-lime glass substrates by using a DC facing target sputtering system. The effects of the CH<sub>4</sub> gas and the substrate temperature on the deposition rate and the properties of the film were investigated. We found that the deposition rate of the film grown under an Ar-CH<sub>4</sub> plasma was about three times larger than that of the film grown under an Ar plasma. The CH<sub>4</sub> gas played a role as an additional carbon precursor to increase the deposition rate, which could be seen as a CH<sup>*</sup> peak at 431 nm in the optical emission spectra of the Ar-CH<sub>4</sub> plasma. The <i>sp</i><sup>3</sup> fraction in the film increased gradually from 32 to 37% as the substrate temperature was increased from 100 ℃ to 400 ℃. The optical band-gap energy of the a-C:H films varied from 3.9 to 3.98 eV, and this variation was closely related to changes in the sp<sup>3</sup> fraction. Overall, these results indicate that the addition of CH<sub>4</sub> gas to a-C:H film deposition enhanced the deposition rate by changing the deposition mechanism from physical to reactive.
참고문헌 (Reference)
1 J. Robertson, 37 : 129-, 2002
2 C. Oppedisano, 75 : 3650-, 1999
3 P. K. Chu, 96 : 253-, 2006
4 H. T. Kim, 86 : 2148-, 2012
5 Y. Miyajima, 105 : 073521-, 2009
6 F. C. Marques, 30 : 527-, 2000
7 H. P. Wang, 204 : 2246-, 2010
8 J. Robertson, 50 : 185-, 1992
9 B. Dishler, 48 : 105-, 1983
10 J. Tauc, 15 : 627-, 1966
1 J. Robertson, 37 : 129-, 2002
2 C. Oppedisano, 75 : 3650-, 1999
3 P. K. Chu, 96 : 253-, 2006
4 H. T. Kim, 86 : 2148-, 2012
5 Y. Miyajima, 105 : 073521-, 2009
6 F. C. Marques, 30 : 527-, 2000
7 H. P. Wang, 204 : 2246-, 2010
8 J. Robertson, 50 : 185-, 1992
9 B. Dishler, 48 : 105-, 1983
10 J. Tauc, 15 : 627-, 1966
11 J. E. Castle, 106 : 65-, 2000
12 J. Schwan, 80 : 440-, 1996
13 A. C. Ferrari, 61 : 14095-, 2000
14 S. V. Avtaeva, 33 : 774-, 2007
15 A. V. Eletskii, 39 : 1137-, 1996
16 F. C. Marques, 83 : 3099-, 2003
17 J. P. Sullivan, 26 : 1021-, 1997
18 J. R. Shi, 198 : 437-, 2005
19 J. R. Shi, 420 : 172-, 2002
20 S. S. Nathan, 292 : 20-, 1997
21 J. Mort, "Plasma Deposited Thin Films" CRC Press Inc. 1986
22 Hong Tak Kim, "Measurements of Plasma Parameters in Low-Frequency (60 Hz) Hydrogen Discharge" 한국물리학회 42 (42): 916-919, 2003
23 M. Ohring, "Materials Science of Thin Films" Academic Press 2002
24 K. A. Jackson, "Kinetic Process: Crystal Growth, Diffusion, and Phase Transitions in Materials" Wiley-VCH 2004
25 S. M. Rossnagel, "Handbook of Plasma Processing Technology: Fundamentals, Etching, Deposition, and Surface Interactions" Noyes Publications 1990
26 김홍탁, "Effects of nitrogen flow rate on titanium nitride films deposition by DC facing target sputtering method" 한국화학공학회 29 (29): 676-679, 2012
27 S. Sivaram, "Chemical Vapor Deposition: Thermal and Plasma Deposition of Electronic Materials" Van Nostrand Reinhold 1995
28 NIST, "Atomic Spectra Database Lines Data"
Transport Properties of MgB2 Films Grown on Hastelloy Tape: Substrate Temperature Effect
Optimization of a Micropillar Cavity for an Efficient Single-photon Source
학술지 이력
| 연월일 | 이력구분 | 이력상세 | 등재구분 |
|---|---|---|---|
| 2023 | 평가 | 해외DB학술지평가 신청대상 (해외등재 학술지 평가) | |
| 2020-01-01 | 등재 | 등재학술지 유지 (해외등재 학술지 평가) | ![]() |
| 2011-01-01 | 등재 | 등재학술지 유지 (등재유지) | ![]() |
| 2009-01-01 | 등재 | 등재학술지 유지 (등재유지) | ![]() |
| 2007-01-01 | 등재 | SCI 등재 (등재유지) | ![]() |
| 2005-01-01 | 등재 | 등재학술지 유지 (등재유지) | ![]() |
| 2002-07-01 | 등재 | 등재학술지 선정 (등재후보2차) | ![]() |
| 2000-01-01 | 등재 | 등재후보학술지 선정 (신규평가) | ![]() |
학술지 인용정보
| 기준연도 | WOS-KCI 통합IF(2년) | KCIF(2년) | KCIF(3년) |
|---|---|---|---|
| 2016 | 0.47 | 0.15 | 0.31 |
| KCIF(4년) | KCIF(5년) | 중심성지수(3년) | 즉시성지수 |
| 0.26 | 0.2 | 0.26 | 0.03 |