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      SCOPUS KCI등재

      연속 ECR-CVD 조업하에 RF-magnetron-sputter의 싸이클조업을 통해 PET위에 올려진 구리박막의 특성 = Characteristic of Copper Films on PET Substrate Deposited by Cyclic Operation of RF-magnetron-sputtering Coupled with Continuous Operation of ECR-CVD

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      https://www.riss.kr/link?id=A105149245

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      다국어 초록 (Multilingual Abstract)

      Preparation of copper film on PET substrate was carried out by cyclic operation of RF-magnetron­sputtering under continuous operation of ECR-CVD. The purpose of this study is aimed to an increase in deposition rate with keeping excellent adhesion between copper film and PET. In order to optimize the sputtering time under continuous ECR-CVD, cyclic operation concept is employed. By changing parameters of cyclic operation such as split of e and cycle time of A, the characteristics and thickness of the deposited copper film are controlled. As $\theta$ value increase, film thickness could confirm to increase and its surface resistivity value decreases. The highest adhesive strength appears at $\theta=0.33$ and cycle time of 30 min. The uniformity of copper film shows $5\%$ in our experimental range.
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      Preparation of copper film on PET substrate was carried out by cyclic operation of RF-magnetron­sputtering under continuous operation of ECR-CVD. The purpose of this study is aimed to an increase in deposition rate with keeping excellent adhesion bet...

      Preparation of copper film on PET substrate was carried out by cyclic operation of RF-magnetron­sputtering under continuous operation of ECR-CVD. The purpose of this study is aimed to an increase in deposition rate with keeping excellent adhesion between copper film and PET. In order to optimize the sputtering time under continuous ECR-CVD, cyclic operation concept is employed. By changing parameters of cyclic operation such as split of e and cycle time of A, the characteristics and thickness of the deposited copper film are controlled. As $\theta$ value increase, film thickness could confirm to increase and its surface resistivity value decreases. The highest adhesive strength appears at $\theta=0.33$ and cycle time of 30 min. The uniformity of copper film shows $5\%$ in our experimental range.

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      참고문헌 (Reference)

      1 Gu, "M. J. Hampden-Smith" 1999

      2 Hiroaki Hayashi, "KiyoshI Ogata, Mat" 1998

      3 Saha, "J. Stejskal, O. Quadrat" Pysica A 335 2004

      4 T. T. Kodas, "J. Hamden-smith," 1996

      5 Martin, "J Esteve, S. Boross," 2004

      6 Matsuo, "Handbook of Thin film Deposition Processes and techniques" 1988

      7 Asmussen, "Hand book of plasma processing technology" 1990p

      8 Band, "H.M. Dunlop, M Jacquet" 1995

      9 Seok Kim, "Doo-Jin Choi" Doo-Jin Choi 320-95, 1998

      10 Bobzin, "Bobzin, M. Maes, A. Kramer" 2004

      1 Gu, "M. J. Hampden-Smith" 1999

      2 Hiroaki Hayashi, "KiyoshI Ogata, Mat" 1998

      3 Saha, "J. Stejskal, O. Quadrat" Pysica A 335 2004

      4 T. T. Kodas, "J. Hamden-smith," 1996

      5 Martin, "J Esteve, S. Boross," 2004

      6 Matsuo, "Handbook of Thin film Deposition Processes and techniques" 1988

      7 Asmussen, "Hand book of plasma processing technology" 1990p

      8 Band, "H.M. Dunlop, M Jacquet" 1995

      9 Seok Kim, "Doo-Jin Choi" Doo-Jin Choi 320-95, 1998

      10 Bobzin, "Bobzin, M. Maes, A. Kramer" 2004

      11 Ardelean, "Appl. Sur. Sci." 2002

      12 L Lim, ".W.L Lim, E.T. Kang, K.G." 2001

      13 Lim, ", M. Isshiki" 2003

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      학술지 이력

      학술지 이력
      연월일 이력구분 이력상세 등재구분
      2023 평가예정 해외DB학술지평가 신청대상 (해외등재 학술지 평가)
      2020-01-01 평가 등재학술지 유지 (해외등재 학술지 평가) KCI등재
      2014-03-01 평가 SCOPUS 등재 (기타) KCI등재
      2011-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2009-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2007-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2005-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2002-01-01 평가 등재학술지 선정 (등재후보2차) KCI등재
      1999-07-01 평가 등재후보학술지 선정 (신규평가) KCI등재후보
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      학술지 인용정보

      학술지 인용정보
      기준연도 WOS-KCI 통합IF(2년) KCIF(2년) KCIF(3년)
      2016 0.15 0.15 0.14
      KCIF(4년) KCIF(5년) 중심성지수(3년) 즉시성지수
      0.14 0.13 0.255 0.03
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