Energy level alignments at the interface of N,N′-di(1-naphthyl)-N,N′-diphenyl-(1,1′-biphenyl)-4,4′-diamine (NPB) / VO2 / fluorine-doped tin oxide (FTO) were investigated by photoemission spectroscopy. The hole injection barrier between FTO and...

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https://www.riss.kr/link?id=T13597219
Seoul : Graduate School, Yonsei University, 2014
학위논문(석사) -- Graduate School, Yonsei University , Institute of Physics and Applied Physics , 2014.8
2014
영어
서울
정공 주입 층으로 사용한 바나듐 다이옥사이드의 특징 분석
v, 30장 : 삽화 ; 26 cm
지도교수: Yeonjin Yi
0
상세조회0
다운로드다국어 초록 (Multilingual Abstract)
Energy level alignments at the interface of N,N′-di(1-naphthyl)-N,N′-diphenyl-(1,1′-biphenyl)-4,4′-diamine (NPB) / VO2 / fluorine-doped tin oxide (FTO) were investigated by photoemission spectroscopy. The hole injection barrier between FTO and...
Energy level alignments at the interface of N,N′-di(1-naphthyl)-N,N′-diphenyl-(1,1′-biphenyl)-4,4′-diamine (NPB) / VO2 / fluorine-doped tin oxide (FTO) were investigated by photoemission spectroscopy. The hole injection barrier between FTO and NPB was reduced from 1.38 eV to 0.59 eV with the insertion of VO2 hole injection layer (HIL). This is due to the direct hole injection from FTO to NPB through shallow valence band maximum (VBM) of VO2.
Interestingly, VO2 can also act as a charge generation layer (CGL) at the same time due to its small band gap of 0.7 eV. Its conduction band minimum(CBM) is relatively close to the Fermi level, thus electrons from the highest occupied molecular orbital (HOMO) of NPB can be easily extracted when a bias is applied under device operation.