1 Vouk, M.A, "Using reliability models during testing with nonoperational profile" 103-111, 1992
2 Gokhale, S.S., "Unification of finite failure non-homogeneous Poisson process models through test coverage" 299-307, 1996
3 Yamada, S., "Testing-domain dependent software reliability growth models and their comparisons of goodness-of-fit" 8 : 205-218, 2001
4 Sedigh-Ali, S., "Temporal modeling of software test coverage" 823-828, 2002
5 Malaiya, Y. K., "Software reliability growth and test coverage" 51 : 420-426, 2002
6 Pasquini, A., "Sensitivity of reliability–rowth models to operational profile errors vs testing accuracy" 45 : 531-540, 1996
7 Pham, H., "NHPP software reliability and cost models with testing coverage" 145 : 443-454, 2003
8 Park, J.-Y., "Integration of imperfect debugging in general testing-domain dependent NHPP SRGM. International Journal of Reliability" 12 : 493-505, 2005
9 Gokhale, S.S., "From test count to code coverage using the lognormal failure rate" 295-305, 2004
10 Gokhale, S.S., "Dynamic code coverage metrics: A lognormal perspective" 2005
1 Vouk, M.A, "Using reliability models during testing with nonoperational profile" 103-111, 1992
2 Gokhale, S.S., "Unification of finite failure non-homogeneous Poisson process models through test coverage" 299-307, 1996
3 Yamada, S., "Testing-domain dependent software reliability growth models and their comparisons of goodness-of-fit" 8 : 205-218, 2001
4 Sedigh-Ali, S., "Temporal modeling of software test coverage" 823-828, 2002
5 Malaiya, Y. K., "Software reliability growth and test coverage" 51 : 420-426, 2002
6 Pasquini, A., "Sensitivity of reliability–rowth models to operational profile errors vs testing accuracy" 45 : 531-540, 1996
7 Pham, H., "NHPP software reliability and cost models with testing coverage" 145 : 443-454, 2003
8 Park, J.-Y., "Integration of imperfect debugging in general testing-domain dependent NHPP SRGM. International Journal of Reliability" 12 : 493-505, 2005
9 Gokhale, S.S., "From test count to code coverage using the lognormal failure rate" 295-305, 2004
10 Gokhale, S.S., "Dynamic code coverage metrics: A lognormal perspective" 2005
11 Piwowarski, P., "Coverage measure experience during function test" 287-301, 1993
12 Park, J.-Y., "Coverage growth functions for software reliability modeling" 435-442, 2006
13 Fujiwara, T., "Co coverage-measure and testing-domain metrics based on a software reliability growth model" 9 : 329-340, 2002
14 Grottke, M., "A vector markov model for structural coverage growth and the number of failure occurrences" 304-315, 2002
15 Gokhale, S. S., "A time/structure based software reliability model" 8 : 21-85, 1999
16 Yamamoto, T., "A software reliability growth model with testing-coverage maturity process" 299-303, 2004
17 Fujiwara, T., "A software reliability growth model with module composition" 266-270, 2005
18 Park, J.-Y., "A coverage function for arbitrary testing profile and its performance" 6 : 87-89, 2005
19 박중양, "A Class of Discrete Time Coverage Growth Functions for Software Reliability Engineering" 한국통계학회 14 (14): 497-506, 2007