Handbook of basic electronic troubleshooting

목차 (Table of Contents)

• CONTENTS
• Preface = xiii
• 1. Introduction to Troubleshooting = 1
• 1-1. Overall troubleshooting procedure = 2
• 1-1.1 Determining trouble symptoms = 3
• 1-1.2 Localizing trouble to a functioning unit = 3
• 1-1.3 Isolating trouble to a circuit = 7
• 1-1.4 Locating the specific trouble = 8
• 1-1.5 Developing a systematic, logical troubleshooting procedure = 8
• 1-2. Relationship among troubleshooting steps = 9
• 1-3. Modification of the troubleshooting procedure = 11
• 1-4. Determining trouble symptoms = 12
• 1-4.1 Knowing the equipment = 13
• 1-4.2 Use of operating controls during troubleshooting = 14
• 1-4.3 Improper adjustment of operating controls = 14
• 1-4.4 Initial settings of operating controls = 15
• 1-4.5 Recognizing trouble symptoms = 16
• 1-4.6 Equipment failure versus degraded performance = 16
• 1-4.7 Evaluation of symptoms = 18
• 1-4.8 Recording troubleshooting information = 19
• 1-4.9 Evaluating equipment performance = 20
• 1-4.10 Summary of determining trouble symptoms = 21
• 1-5. Localizing trouble to a functional unit = 21
• 1-5.1 The meaning of "localize" in troubleshooting = 21
• 1-5.2 Functional divisions of equipment = 22
• 1-5.3 Functional block diagrams = 24
• 1-5.4 Bracketing technique = 27
• 1-5.5 Examples of bracketing = 27
• 1-5.6 Which unit to test first = 33
• 1-5.7 Modifying the trouble-localization sequence = 37
• 1-5.8 Verifying trouble symptoms = 38
• 1-6. Isolating trouble to a circuit = 39
• 1-6.1 Servicing block diagrams = 39
• 1-6.2 Signal paths = 43
• 1-6.3 Signal tracing versus signal substitution = 44
• 1-6.4 Half-split technique = 45
• 1-6.5 Isolating trouble to a circuit within a circuit group = 49
• 1-7. Locating a specific trouble = 60
• 1-7.1 Locating troubles in plug-in modules = 60
• 1-7.2 Inspection using the senses = 60
• 1-7.3 Testing to locate a faulty component = 61
• 1-7.4 Wave-form measurements = 64
• 1-7.5 Voltage measurements = 66
• 1-7.6 Resistance measurements = 68
• 1-7.7 Duplicating wave-form, voltage, and resistance measurements = 68
• 1-7.8 Using schematic diagrams = 69
• 1-7.9 Internal adjustment during trouble localization = 75
• 1-7.10 Trouble resulting from more than one fault = 76
• 1-7.11 Repairing troubles = 77
• 1-7.12 Operational checkout = 78
• 2. Test Equipment Used for Basic Troubleshooting = 80
• 2-1. Safety precautions in troubleshooting = 80
• 2-2. Analog meters = 82
• 2-2.1 Meter basics = 82
• 2-2.2 Basic VOM = 83
• 2-2.3 Basic AC meters = 88
• 2-2.4 Electronic analog meters = 91
• 2-2.5 Meter scales and ranges = 94
• 2-2.6 Parallax problem = 101
• 2-2.7 Basic meter operating procedures = 103
• 2-2.8 Basic ohmmeter(resistance) measurements = 104
• 2-2.9 Basic voltmeter(voltage) measurements = 105
• 2-2.10 Basic ammeter(current) measurements = 108
• 2-2.11 Basic dB measurements = 109
• 2-3. Digital meters = 109
• 2-4. Bridge-type test equipment = 111
• 2-5. Signal generators = 112
• 2-5.1 Signal generator basics = 113
• 2-5.2 RF signal generators = 113
• 2-5.3 Audio generators and function generators = 118
• 2-6. Oscilloscopes = 123
• 2-6.1 Oscilloscope operating precautions = 124
• 2-6.2 Placing an oscilloscope in operation = 125
• 2-6.3 Measuring wave-form voltage with an oscilloscope = 127
• 2-6.4 Measuring time and frequency with an oscilloscope = 133
• 2-7. Probes = 138
• 2-7.1 Basic probe = 138
• 2-7.2 Low-capacitance probes = 139
• 2-7.3 Resistance-type voltage-divider probes = 139
• 2-7.4 Capacitance-type voltage-divider probes = 140
• 2-7.5 RF probes = 141
• 2-7.6 Demodulator probes = 142
• 2-7.7 Special-purpose probes = 143
• 2-7.8 Probe compensation and calibration = 145
• 2-7.9 Probe troubleshooting techniques = 146
• 3. Troubleshooting Basic Circuits and Equipment = 148
• 3-1. Troubleshooting notes = 148
• 3-1.1 Solid-state servicing techniques = 148
• 3-1.2 Measuring voltages in circuit = 151
• 3-1.3 Troubleshooting with transistor voltages = 154
• 3-1.4 Testing transistors in circuit (forward-bias method) = 156
• 3-1.5 Using transistor tesiters in troubleshooting = 159
• 3-1.6 Testing transistors out of circuit = 160
• 3-1.7 Testing diodes out of circuit = 162
• 3-1.8 Troubleshooting ICs = 163
• 3-1.9 Effects of capacitors in troubleshooting = 165
• 3-1.10 Effects of voltage on circuit resistance = 169
• 3-1.11 Effects of voltage of poor solder joints = 169
• 3-2. Amplifiler troubleshooting = 170
• 3-2.1 Basic amplifier troubleshooting approach 170
• 3-2.2 Amplifier frequency response = 171
• 3-2.3 Amplifier voltage-gain measurement = 174
• 3-2.4 Power-output and -gain measurement = 174
• 3-2.5 Power-bandwidth measurement = 174
• 3-2.6 Load-sensitivity measurement = 174
• 3-2.7 Dynamic output-impedance measurement = 175
• 3-2.8 Dynamic input-impedance measurement = 175
• 3-2.9 Checking distortion by sine-wave analysis = 176
• 3-2.10 Checking distortion by square-wave analysis = 176
• 3-2.11 Harmonic-distortion measurement = 178
• 3-2.12 Intermodulation-noise measurement = 179
• 3-2.13 Background-noise measurement = 180
• 3-2.14 Feedback-amplifier troubleshooting = 181
• 3-2.15 Feedback-amplifier troubleshooting procedures = 185
• 3-2.16 Effects of transistor leakage on amplifier gain = 187
• 3-2.17 Example of audio-amplifier troubleshooting = 190
• 3-3. Receiver troubleshooting = 201
• 3-3.1 Testing receiver-tuning circuits = 201
• 3-3.2 Example of receiver troubleshooting = 206
• 3-4. Transmitter troubleshooting = 211
• 3-4.1 Oscillator troubleshooting problems = 212
• 3-4.2 Basic RF tests = 214
• 3-4.3 Basic RF voltage measurement = 214
• 3-4.4 Measuring LC circuit resonant frequency = 215
• 3-4.5 Measuring inductance of a coil = 216
• 3-4.6 Measuring self-resonance and distributed capacitance of a coil = 216
• 3-4.7 Measuring Q of resonant circuits = 218
• 3-4.8 Measuring impedance of resonant circuits = 220
• 3-4.9 Testing transmitter RF amplifier circuits = 220
• 3-4.10 Modulation measurement = 222
• 3-4.11 Example of transmitter troubleshooting = 224
• Index = 233