CuO를 열확산시킨(Sr.Ca)TiO_(3) 입계층 커패시터의 전기적 특성 = Electrical Properties of (Sr.Ca)TiO_(3) Grain Boundary Layer Capacitor with a Thermal Diffusion of the cCpper Oxide

다국어 초록 (Multilingual Abstract)

In this paper, the Sr_(1-x)Ca_(x)TiO_(3)(0≤x≤0.2)-based grain boundary layer ceramics were fabricated to measured dielectric properties with the sintering temperature and the thermal treatment time. The sintering temperature and time were 1420∼1520℃, 4hours, and the thermal treatment temperature and time of the specimen were 1150℃, 1, 2, 3,hours, respectively. The structural and the dielectric properties were investigated by SEM, X-ray, HP4194A and K6517. The average grain size was increased with increasing the sintering temperature, but decreased to 15㏖% with increasing content of Ca. X-ray diffraction analysis results showed that all specimens were the cubic structure, the main peaks were of Ca. The appropriate thermal treatment temperature and time of CuO to obtain dielectric properties of ε_(γ)>50000, tan δ<0.05 and ΔC<±10% were 1150℃ and 2hours, respectively.

목차 (Table of Contents)

• 목차
• 1. 서론 = 392
• 2. 실험 = 392
• 2.1 시편제작 = 392
• 2.2 측정 = 393
• 3. 결과 및 고찰 = 395
• 3.1 구조적 특성 = 395
• 3.2 전기적 특성 = 399
• 4. 결론 = 406
• 참고문헌 = 407