- CONTENTS
- Preface = ⅸ
- Photo of Professor Meshii = xi
- Advanced and Novel Microscopy Techniques
- Examination of Deformation Defects in Bulk Crystals Using Electron Channeling Contrast Imaging / M.A. Crimp = 3

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https://www.riss.kr/link?id=M14431062
Warrendale, Pa. : TMS, c2003
2003
영어
620.1/1299 판사항(21)
0873395352
일반단행본
United States of America
Electron microscopy : its role in materials science : the Mike Meshii Symposium : proceedings of a symposia sponsored by the Mechanical Behavior of Materials Committee (Jt. ASM-MSCTS) of the Structural Materials Division (SMD) of TMS (The Minerals, Metals & Materials Society) with the Japan Institute of Metals : 2003 TMS Annual Meeting, San Diego, California, March 2-6, 2003 / edited by J.R. Weertman ... [et al.]
xi, 359 p. : ill., port. ; 24 cm
Includes bibliographical references.
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다운로드목차 (Table of Contents)