RISS 학술연구정보서비스

검색
다국어 입력

http://chineseinput.net/에서 pinyin(병음)방식으로 중국어를 변환할 수 있습니다.

변환된 중국어를 복사하여 사용하시면 됩니다.

예시)
  • 中文 을 입력하시려면 zhongwen을 입력하시고 space를누르시면됩니다.
  • 北京 을 입력하시려면 beijing을 입력하시고 space를 누르시면 됩니다.
닫기
    인기검색어 순위 펼치기

    RISS 인기검색어

      KCI등재

      NiCr 박막의 발열 특성 개선을 위한 순차적 이중 열처리 방법 연구 = Gradational Double Annealing Process for Improvement of Thermal Characteristics of NiCr Thin Films

      한글로보기

      https://www.riss.kr/link?id=A101055495

      • 0

        상세조회
      • 0

        다운로드
      서지정보 열기
      • 내보내기
      • 내책장담기
      • 공유하기
      • 오류접수

      부가정보

      다국어 초록 (Multilingual Abstract) kakao i 다국어 번역

      NiCr thin film was deposited by DC magnetron sputtering on $A;_2O_3$/Si substrate with NiCr (80:20) alloy target. NiCr thin films were annealed at $300^{\circ}C,\;400^{\circ}C,\;500^{\circ}C,\;600^{\circ}C,\;and\;700^{\circ}C$ for 6 hr in $H_2$ after annealing at $500^{\circ}C$ for 6hr in air atmosphere, respectively. To analyze NiCr thin film properties, the changes of its micro structure were Investigated through field emission scanning electron microscope (FESEM). X-ray photoelectron spectroscopy (XPS) was used to analyze a surface of NiCr thin film. Resistance of NiCr thin film was measured by 4-point probe technique. The generated heats were measured by infrared thermometer through the application of DC voltage (5 V/l2 V). NiCr thin film treated by gradational double annealing process had uniform and small grains. Maximum temperature generated heat by NiCr micro heater was $173^{\circ}C$. We expect that our results will be a useful reference in the realization of NiCr micro heater.
      번역하기

      NiCr thin film was deposited by DC magnetron sputtering on $A;_2O_3$/Si substrate with NiCr (80:20) alloy target. NiCr thin films were annealed at $300^{\circ}C,\;400^{\circ}C,\;500^{\circ}C,\;600^{\circ}C,\;and\;700^{\circ}C$ for 6 hr in $H_2$ after ...

      NiCr thin film was deposited by DC magnetron sputtering on $A;_2O_3$/Si substrate with NiCr (80:20) alloy target. NiCr thin films were annealed at $300^{\circ}C,\;400^{\circ}C,\;500^{\circ}C,\;600^{\circ}C,\;and\;700^{\circ}C$ for 6 hr in $H_2$ after annealing at $500^{\circ}C$ for 6hr in air atmosphere, respectively. To analyze NiCr thin film properties, the changes of its micro structure were Investigated through field emission scanning electron microscope (FESEM). X-ray photoelectron spectroscopy (XPS) was used to analyze a surface of NiCr thin film. Resistance of NiCr thin film was measured by 4-point probe technique. The generated heats were measured by infrared thermometer through the application of DC voltage (5 V/l2 V). NiCr thin film treated by gradational double annealing process had uniform and small grains. Maximum temperature generated heat by NiCr micro heater was $173^{\circ}C$. We expect that our results will be a useful reference in the realization of NiCr micro heater.

      더보기

      참고문헌 (Reference)

      1 "성문 이화학사전" 573-, 1995.

      2 "Tin oxide microsensor for LPG monitoring" 20 (20): 139-, 1994.

      3 "The midrange and high tem- perature dependence of vacuum deposited NiCrthinfilmresistors" 45 (45): 5-, 1994.

      4 "Roles of N2 Gas in Etching of Platinum by Inductively Coupled Ar/Cl2/N2 Plasmas" 18 (18): 1377-, 2000.

      5 "Microtechonlogy and equipment for manugactruing SiC-based sensors of physical values for extreme operation condition" 30-, 1996.

      6 "Investigation of sliding contact resistance of Ni-Cr/Au and Ni-Cr/Au-SiO2 thin resistive films" 164 : 129-, 1988.

      7 "Integrated array sensor for detection organic solvents" 26 iss. 1-3 : 135-, 1995.

      8 "DC 마그네트론 스퍼터링 NiCr 박막의 열처리 조건에 따른 미세구조 및 표면특성" 18 (18): 554-, 2005.

      9 "Crystallization of amorphous sputtered 55 %Cr-45 %Ni thin films" 92 (92): 315-, 1982.

      10 "Correlation between electrical properties and AES concentration-depth profiles of NiCr thin films" 39 : 219-, 1976.

      1 "성문 이화학사전" 573-, 1995.

      2 "Tin oxide microsensor for LPG monitoring" 20 (20): 139-, 1994.

      3 "The midrange and high tem- perature dependence of vacuum deposited NiCrthinfilmresistors" 45 (45): 5-, 1994.

      4 "Roles of N2 Gas in Etching of Platinum by Inductively Coupled Ar/Cl2/N2 Plasmas" 18 (18): 1377-, 2000.

      5 "Microtechonlogy and equipment for manugactruing SiC-based sensors of physical values for extreme operation condition" 30-, 1996.

      6 "Investigation of sliding contact resistance of Ni-Cr/Au and Ni-Cr/Au-SiO2 thin resistive films" 164 : 129-, 1988.

      7 "Integrated array sensor for detection organic solvents" 26 iss. 1-3 : 135-, 1995.

      8 "DC 마그네트론 스퍼터링 NiCr 박막의 열처리 조건에 따른 미세구조 및 표면특성" 18 (18): 554-, 2005.

      9 "Crystallization of amorphous sputtered 55 %Cr-45 %Ni thin films" 92 (92): 315-, 1982.

      10 "Correlation between electrical properties and AES concentration-depth profiles of NiCr thin films" 39 : 219-, 1976.

      11 "Compo- sition and temperature coefficient of resis- tance of Ni-Cr thin films" 59 (59): 33-, 1979.

      12 "Applications of thermal silicon sensors on membranes" 49 (49): 1-, 1995.

      13 "An integrated mass flow sensor with on-chip CMOS interface ciruitry" 39 (39): 1376-, 1992.

      14 "A substrate for thin-film gas sensors in microelectronic technology" 2 (2): 63-, 1990.

      더보기

      동일학술지(권/호) 다른 논문

      분석정보

      View

      상세정보조회

      0

      Usage

      원문다운로드

      0

      대출신청

      0

      복사신청

      0

      EDDS신청

      0

      동일 주제 내 활용도 TOP

      더보기

      주제

      연도별 연구동향

      연도별 활용동향

      연관논문

      연구자 네트워크맵

      공동연구자 (7)

      유사연구자 (20) 활용도상위20명

      인용정보 인용지수 설명보기

      학술지 이력

      학술지 이력
      연월일 이력구분 이력상세 등재구분
      2026 평가예정 재인증평가 신청대상 (재인증)
      2020-01-01 평가 등재학술지 유지 (재인증) KCI등재
      2017-01-01 평가 등재학술지 유지 (계속평가) KCI등재
      2013-01-01 평가 등재 1차 FAIL (등재유지) KCI등재
      2010-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2008-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2006-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2005-05-30 학회명변경 영문명 : 미등록 -> The Korean Institute of Electrical and Electronic Material Engineers KCI등재
      2004-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2001-01-01 평가 등재학술지 선정 (등재후보2차) KCI등재
      1998-07-01 평가 등재후보학술지 선정 (신규평가) KCI등재후보
      더보기

      학술지 인용정보

      학술지 인용정보
      기준연도 WOS-KCI 통합IF(2년) KCIF(2년) KCIF(3년)
      2016 0.13 0.13 0.13
      KCIF(4년) KCIF(5년) 중심성지수(3년) 즉시성지수
      0.14 0.14 0.247 0.06
      더보기

      이 자료와 함께 이용한 RISS 자료

      나만을 위한 추천자료

      해외이동버튼