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이 학술지의 논문 검색
Methods of Electron Crystallography as Tools for Materials Analysis
Neumann, W.; Kirmse, H.; Hausler, I.; Grosse, C.; Moeck, P.; Rouvimov, S.; Beekman, M.; Atkins, R.; Johnson, D.C.; Volz, K. Scitec Publications Ltd 2012 p.1-6
Characterization of Grain Boundary Geometry in the TEM, Exemplified in Si Thin Films
Labar, J.L.; Kiss, A.K.; Christiansen, S.; Falk, F. Scitec Publications Ltd 2012 p.7-12
Orientation and Phase Mapping in TEM Microscopy (EBSD-TEM Like): Applications to Materials Science
Rauch, E.F.; Veron, M.; Nicolopoulos, S.; Bultreys, D. Scitec Publications Ltd 2012 p.13-15
The Art and Application of Large Angle Convergent Beam Electron Diffraction
Jezierska, E. Scitec Publications Ltd 2012 p.16-19
Cathodoluminescence and Electroluminescence of Semiconductor Structures in SEM
Pluska, M.; Czerwinski, A.; Ratajczak, J.; Szerling, A.; Katcki, J. Scitec Publications Ltd 2012 p.20-23
Slowko, W.; Krysztof, M. Scitec Publications Ltd 2012 p.24-27
Richter, S.; Riediger, K.; Nester, A. Scitec Publications Ltd 2012 p.28-31
Ploszaj, J.; Talik, E.; Piotrowska-Seget, Z.; Pastuszka, J.S. Scitec Publications Ltd 2012 p.32-36
3D Imaging and Metrology of Yttria Dispersoids in INCOLOY MA956 by Electron Tomography
Kruk, A.; Dubiel, B.; Czyrska-Filemonowicz, A. Scitec Publications Ltd 2012 p.37-40
3D Imaging of Strengthening Particles in Cr-V-Mo (13HMF) Steel Using FIB/SEM Tomography
Osuch, W.; Kruk, A.; Michta, G.; Czyrska-Filemonowicz, A. Scitec Publications Ltd 2012 p.41-44