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      3% 방향성 규소강판의 표면 선긋기에 의한 Barkhausen Noise에 관한 연구

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      https://www.riss.kr/link?id=A76075400

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      다국어 초록 (Multilingual Abstract)

      The Barkhausen noise was measured as the change of line width(39 ~ 1.22 ㎜) and scratching angle(90˚ - 50˚) with respect of rolling direction in grain-oriented 3% Si-Fe of 0.30 and 0.27 ㎜ thickness. The two peak phenomena of the noise envelope observed for non-scratching and scratching of line width 39 ㎜ was explained by large activation energy during 180˚ domain wall nucleation and annihilation processes. The amplitudes of the noise envelpoes were decreased as the decrement of scratching line width, but did not almost changed below line width of 9.75 ㎜. It was explained that the decrease in the envelope with increasing scratching number is associated with lower activation energy of 180˚ domain nucleation and annihilation in the vicinity of the scratching area. The noise power was decreased as narrower line width. The dependence of the power on the scratching angle was sharpest decreaded at the 50 angle.
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      The Barkhausen noise was measured as the change of line width(39 ~ 1.22 ㎜) and scratching angle(90˚ - 50˚) with respect of rolling direction in grain-oriented 3% Si-Fe of 0.30 and 0.27 ㎜ thickness. The two peak phenomena of the noise envelope ob...

      The Barkhausen noise was measured as the change of line width(39 ~ 1.22 ㎜) and scratching angle(90˚ - 50˚) with respect of rolling direction in grain-oriented 3% Si-Fe of 0.30 and 0.27 ㎜ thickness. The two peak phenomena of the noise envelope observed for non-scratching and scratching of line width 39 ㎜ was explained by large activation energy during 180˚ domain wall nucleation and annihilation processes. The amplitudes of the noise envelpoes were decreased as the decrement of scratching line width, but did not almost changed below line width of 9.75 ㎜. It was explained that the decrease in the envelope with increasing scratching number is associated with lower activation energy of 180˚ domain nucleation and annihilation in the vicinity of the scratching area. The noise power was decreased as narrower line width. The dependence of the power on the scratching angle was sharpest decreaded at the 50 angle.

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