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      기판온도 및 산소 분위기 가스에 따른 IGZO 투명전도성박막의 구조적 및 전기적 특성 = Effect of Substrate Temperature and Oxygen Ambient Gases on the Structural and Electrical Characteristics of IGZO Thin Films

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      https://www.riss.kr/link?id=A108762010

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      We have investigated the effect of the substrate temperature and oxygen flow rate on the characteristics of IGZO thin films for the TCO (transparent conducting oxide). For this purpose, IGZO thin films were deposited by RF magnetron sputtering at room temperature and 300oC with various O2 flow rate. Experiments were carried out while varying the oxygen gas flow rate from 0sccm to 1.0sccm to see how the oxygen gas affects the IGZO thin films. IGZO thin films deposited at room temperature and 300oC showed amorphous. The lowest resistivity value was 2125x10-3 Ωcm when the IGZO film was deposited at RT and set up at 0.1sccm. As the oxygen vacancy rate decreased, the resistivity intended to increase. In conclusion, Oxygen vacancy affects the IGZO thin film’s electrical characteristic.
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      We have investigated the effect of the substrate temperature and oxygen flow rate on the characteristics of IGZO thin films for the TCO (transparent conducting oxide). For this purpose, IGZO thin films were deposited by RF magnetron sputtering at room...

      We have investigated the effect of the substrate temperature and oxygen flow rate on the characteristics of IGZO thin films for the TCO (transparent conducting oxide). For this purpose, IGZO thin films were deposited by RF magnetron sputtering at room temperature and 300oC with various O2 flow rate. Experiments were carried out while varying the oxygen gas flow rate from 0sccm to 1.0sccm to see how the oxygen gas affects the IGZO thin films. IGZO thin films deposited at room temperature and 300oC showed amorphous. The lowest resistivity value was 2125x10-3 Ωcm when the IGZO film was deposited at RT and set up at 0.1sccm. As the oxygen vacancy rate decreased, the resistivity intended to increase. In conclusion, Oxygen vacancy affects the IGZO thin film’s electrical characteristic.

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      참고문헌 (Reference)

      1 권수경 ; 이규만, "산소 유량에 따른 IZO 박막의 전기적 및 광학적 특성" 한국반도체디스플레이기술학회 12 (12): 49-54, 2013

      2 홍경림 ; 이규만, "기판 온도와 분위기 가스에 따른 AZO 박막의 구조적 및 전기적 특성" 한국반도체디스플레이기술학회 20 (20): 1-6, 2021

      3 Radhouane Bel Hadj Tahar, "Tin doped indium oxide thin films: Electrical properties" 83 : 2631-2645, 1998

      4 Y. Hoshi, "Structure and electrical properties of ITO thin films deposited at high rate by facing target sputtering" 445 : 245-250, 2003

      5 L. Raniero, "Role of hydrogen plasma on electrical and optical properties of ZGO, ITO and IZO transparent and conductive coatings" 511-512 : 295-298, 2006

      6 Tania Konry, "Physico-chemical studies of indium tin oxide-coated fiber optic biosensors" 492 : 313-321, 2005

      7 K. Ishibashi, "Mass spectrometric ion analysis in the sputtering of oxide targets" 10 (10): 1718-1722, 1992

      8 K. K. Banger, "Low-temperature, high-performance solution-processed metal oxide thin-film transistors formed by a ‘sol–gel on chip’ process" 10 : 45-50, 2011

      9 H. Hosono, "Ionic amorphous oxide semiconductors: Material design, carrier transport, and device application" 352 : 851-858, 2002

      10 Y. S. Jung, "Influence of DC magnetron sputtering parameters on the properties of amorphous indium zinc oxide thin film" 445 : 63-71, 2003

      1 권수경 ; 이규만, "산소 유량에 따른 IZO 박막의 전기적 및 광학적 특성" 한국반도체디스플레이기술학회 12 (12): 49-54, 2013

      2 홍경림 ; 이규만, "기판 온도와 분위기 가스에 따른 AZO 박막의 구조적 및 전기적 특성" 한국반도체디스플레이기술학회 20 (20): 1-6, 2021

      3 Radhouane Bel Hadj Tahar, "Tin doped indium oxide thin films: Electrical properties" 83 : 2631-2645, 1998

      4 Y. Hoshi, "Structure and electrical properties of ITO thin films deposited at high rate by facing target sputtering" 445 : 245-250, 2003

      5 L. Raniero, "Role of hydrogen plasma on electrical and optical properties of ZGO, ITO and IZO transparent and conductive coatings" 511-512 : 295-298, 2006

      6 Tania Konry, "Physico-chemical studies of indium tin oxide-coated fiber optic biosensors" 492 : 313-321, 2005

      7 K. Ishibashi, "Mass spectrometric ion analysis in the sputtering of oxide targets" 10 (10): 1718-1722, 1992

      8 K. K. Banger, "Low-temperature, high-performance solution-processed metal oxide thin-film transistors formed by a ‘sol–gel on chip’ process" 10 : 45-50, 2011

      9 H. Hosono, "Ionic amorphous oxide semiconductors: Material design, carrier transport, and device application" 352 : 851-858, 2002

      10 Y. S. Jung, "Influence of DC magnetron sputtering parameters on the properties of amorphous indium zinc oxide thin film" 445 : 63-71, 2003

      11 K. Tominaga, "ITO films prepared by facing target system" 281-282 : 194-197, 1996

      12 N. Ito, "Electrical and optical properties of amorphous indium zinc oxide films" 496 (496): 99-103, 2006

      13 K. Nomura, "Effects of diffusion of hydrogen and oxygen on electrical properties of amorphous oxide semiconductor, In-Ga-Zn-O" 2 : 5-8, 2013

      14 Takafumi Aoi, "DC sputter deposition of amorphous indium-gallium-zinc-oxide(a-IGZO) films with H2O introduction" 518 : 3004-3007, 2010

      15 한승익 ; 김홍배, "A Study on Properties of RF-sputtered Al-doped ZnO Thin Films Prepared with Different Ar Gas Flow Rates" 한국진공학회 25 (25): 145-148, 2016

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