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단안 삼출성 나이관련황반변성 환자의 무증상 반대안의 외망막층 두께 변화
정현교(Hyun Kyo Jeong),김성수(Sung Soo Kim),박현주(Hyun Ju Park) 대한안과학회 2017 대한안과학회지 Vol.58 No.9
Purpose: To compare the outer retinal thickness in normal fellow eyes of patients with unilateral age-related macular degeneration (AMD) and normal control eyes. Methods: We retrospectively reviewed the medical records of 60 patients with unilateral exudative AMD including polypoidal choroidal vasculopathy and 60 normal controls. Spectralis optical coherence tomography was performed in the normal fellow eyes of patients with unilateral AMD and in the normal group. The thicknesses between the retinal pigment epithelium (RPE) line and the cone outer segment tips (COST) line, between the COST line and the photoreceptor inner segment/outer segment (IS/OS) line, and between the IS/OS line and the external limiting membrane (ELM) line were measured at the fovea in both groups. Results: The thickness between the RPE and COST lines was 32.4 ± 3.0 μm in normal fellow eyes of patients with unilateral AMD and 35.3 ± 3.5 μm in the normal group (p < 0.001). Total retinal thickness, thicknesses between the COST and the IS/OS lines and the IS/OS and the ELM lines in fellow eyes were not significantly different from those of normal eyes (p = 0.126, 0.615, 0.874). There was no significant difference in total retinal thickness or each outer retinal thickness measured in normal fellow eyes between patients with neovascular AMD and polypoidal choroidal vasculopathy. Conclusions: The thickness between the RPE and the COST lines was thinner in the fellow eyes of patients with unilateral AMD than in the normal eyes. We suggest that less thickness between the RPE and COST lines might indicate a greater risk of AMD. J Korean Ophthalmol Soc 2017;58(9):1036-1041
600 kJ SMES용 열 전도판의 구조에 따른 와전류 손실 특성
이상엽(Sang-Yub Lee),곽상엽(Sang-Yeop Kwak),박명진(Myung-Jin Park),김우석(Woo-Seok Kim),이지광(Ji-Kwang Lee),최경달(Kyeong-Dal Choi),배준한(Joon-Han Bae),김석호(Seok-Ho Kim),심기덕(Ki-Duk Sim),성기철(Ki-Chul Seong),정현교(Hyun-Kyo Ju 대한전기학회 2007 대한전기학회 학술대회 논문집 Vol.2007 No.4
본 논문에서는 600kJ급 SMES용 열전도판의 와전류 손실의 해석에 대해서 나타내었다. SMES의 운전 상태는 충전, 운전, 방전의 3가지 구간으로 나누어 볼 수 있다. 이 중 방전 구간에서는 SMES 코일에서의 전류 감소에 의해서 와전류 손실이 발생한다. 이때 발생하는 와전류 손실은 짧은 시간동안 발생하지만 그 크기가 크기 때문에, SMES 시스템 설계 시 냉각 시스템의 효율과 안정성을 위해서 반드시 고려되어야만 한다. 본 논문에서는 이러한 열전도판의 와전류 손실을 해석하고, 그 형상의 변화에 따른 와전류 손실 값들을 분석하였다.