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주파수에 따른 임피던스 변화를 이용한 OLED 소자의 열화 분석
김현종(Hyunjong Kim),예석민(Seok Min Ye),노승욱(Seunguk Noh),이창희(Changhee Lee),홍용택(Yongtaek Hong) 대한전자공학회 2007 대한전자공학회 학술대회 Vol.2007 No.11
We report an electrical equivalent circuit modeling for fresh and aged organic light emitting diode (OLED) by using impedance spectroscopy. A standard Alq₃-based OLED of ITO/mMTDATA/α-NPB/Alq3/LiF/Al on glass substrate was used. Equivalent reactance and resistance measured at different frequencies was used to model organic bulk layer and interface as a combination of capacitors and resistors. Cole-Cole plot of the measured impedance showed that the frequencies where maximum magnitude of reactance and where reactance changes from negative to positive have been lowered after the OLED was aged. These frequency shifts can be explained by an equivalent time constant for each organic layer and organic/organic interface; thus, can be used to study OLED degradation mechanisms.