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노승용,김철주,홍완희,김성환,김영호,민병현 서울市立大學校 1988 論文集 Vol.22 No.-
In this pater, new design method for VLSI fault test are proposed by using built-in self test technique. The ordering algorithm for effective test pattern generation and the design method multi-input signature analysis for improving the fault detection capability are suggested. Also, a new multi-function BILBO(Built In Logic Block Observer) is sugested to reduce the hardware. By involbing the latch of sequential circuit into the BILBO, Built In Self Test can be executed effectively. The above proposed multifunctional BILBO was designed to operate both at a test pattern generator and a signature analyzer for reduction of the additional circuit and test time. Moreover, by using input and output line of multifunctional BILBO as a common, the external terminal are saved and the internal chip wiring can be done easily, and also the propagation delay of data signal is not ocurred. Through the implementation of test pattern generation and reordering and algorithm and multifunctional BILBO with C-language on the VAX 11/750(UNIX) computer, the efficienty of algorithm and the availability of designed method are verified.