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あぁかがさざただなはばぱまやゃらわゎんいぃきぎしじちぢにひびぴみりうぅくぐすずつづっぬふぶぷむゆゅるえぇけげせぜてでねへべぺめれおぉこごそぞとどのほぼぽもよょろを

アァカサザタダナハバパマヤャラワヮンイィキギシジチヂニヒビピミリウゥクグスズツヅッヌフブプムユュルエェケゲセゼテデヘベペメレオォコゴソゾトドノホボポモヨョロヲ ―

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Α Β Γ Δ Ε Ζ Η Θ Ι Κ Λ Μ Ν Ξ Ο Π Ρ Σ Τ Υ Φ Χ Ψ Ω α β γ δ ε ζ η θ ι κ λ μ ν ξ ο π ρ σ τ υ φ χ ψ ω

á à Á À é è É È ç Ç ê

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Post-Process Modification of CeOx/C-Supported PtCu Thin Film Catalyst and Its Catalytic Activity for Hydrogen Evolution Reaction

Yumeng Zhao,Bin Yang,Xinyu Hao,Zhijing Zhao 성균관대학교(자연과학캠퍼스) 성균나노과학기술원 2015 NANO Vol.10 No.6
CeOx/C supported PtCu thin film catalysts were prepared by ion beam sputtering (IBS) and subsequently annealed at 400℃ under vacuum environment and electrochemically dealloyed. Scanning transmission electronic microscope (STEM) and atomic force microscope (AFM) characterizations show that the surface of post-processed catalyst presents nanoporous structure and has a high root mean square roughness ( RMS=13.9 nm). Electrochemical measurements indicate that the post-processed PtCu – CeOx/C catalyst shows higher catalytic activity towards hydrogen evolution reaction than pure Pt/C. While inductively coupled plasma atomic emission spectroscopy (ICP-AES) analysis displays that the platinum (Pt) loading of the post-processed PtCu – CeOx/C is 0.1192 mg/cm2, decreasing by 20% compare to pure Pt/C (0.1490 mg/cm2). X-ray photoelectron spectroscopy (XPS) analysis confirms that the surface of post-processed PtCu – CeOx/C enrich Pt and analyzes the chemical valence of Pt element using depth profiling technology. It can be inferred that the enhancement in catalytic property is attributed to the combined action between geometric structure effect and electronic modification effect of Pt atoms from CeOx support.